Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene

Autor: Reed, Benjamen, Cant, David, Spencer, Steve, Carmona-Carmona, Abraham Jorge, Bushell, Adam, Herrera-Gómez, Alberto, Kurokawa, Akira, Thissen, Andreas, Thomas, Andrew, Britton, Andrew, Bernasik, Andrzej, Fuchs, Anne, Baddorf, Arthur, Bock, Bernd, Theilacker, Bill, Cheng, Bin, Castner, David, Morgan, David, Valley, David, Willneff, Elizabeth, Smith, Emily, Nolot, Emmanuel, Xie, Fangyan, Zorn, Gilad, Smith, Graham, Yasufuku, Hideyuki, Fenton, Jeffery, Chen, Jian, Counsell, Jonathan, Radnik, Jörg, Gaskell, Karen, Artyushkova, Kateryna, Yang, Li, Zhang, Lulu, Eguchi, Makiho, Walker, Marc, Hajdyła, Mariusz, Marzec, Mateusz, Linford, Matthew, Kubota, Naoyoshi, Cortazar-Martínez, Orlando, Dietrich, Paul, Satoh, Riki, Schroeder, Sven, Avval, Tahereh, Nagatomi, Takaharu, Fernandez, Vincent, Lake, Wayne, Azuma, Yasushi, Yoshikawa, Yusuke, Compean-Gonzalez, Claudia L., Ceccone, Giacomo, Shard, Alexander G.

Publikováno v: Journal of Vacuum Science & Technology A
Journal of Vacuum Science & Technology A, 2020, 38 (6), pp.063208. ⟨10.1116/6.0000577⟩
Journal of Vacuum Science and Technology A
Journal of Vacuum Science and Technology A, American Vacuum Society, 2020, 38 (6), pp.063208. ⟨10.1116/6.0000577⟩
J Vac Sci Technol A
NPL Versailles project 2020, ' Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene ', Journal of Vacuum Science & Technology A . https://doi.org/10.1116/6.0000577

International audience; We report the results of a Versailles Project on Advanced Materials and Standards interlaboratory study on the intensity scale calibration of x-ray photoelectron spectrometers using low-density polyethylene (LDPE) as an altern

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7e43da9e608d53310d13a18a2a168c84
https://hal.science/hal-03105700

ERRATUM: "Versailles project on advanced materials and standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene" [J. Vac. Sci. Technol. A 38, 063208 (2020)].

Autor: Reed, Benjamen P., Cant, David J. H., Spencer, Steve J., Carmona-Carmona, Abraham Jorge, Bushell, Adam, Herrera-Gómez, Alberto, Kurokawa, Akira, Thissen, Andreas, Thomas, Andrew G., Britton, Andrew J., Bernasik, Andrzej, Fuchs, Anne, Baddorf, Arthur P., Bock, Bernd, Theilacker, Bill, Cheng, Bin, Castner, David G., Morgan, David J., Valley, David, Willneff, Elizabeth A.

Publikováno v: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Mar2021, Vol. 39 Issue 2, p1-3, 3p

Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene.

Autor: Reed BP; National Physical Laboratory, Hampton Road, Teddington TW11 0LW, United Kingdom., Cant DJH; National Physical Laboratory, Hampton Road, Teddington TW11 0LW, United Kingdom., Spencer SJ; National Physical Laboratory, Hampton Road, Teddington TW11 0LW, United Kingdom., Carmona-Carmona AJ; CINVESTAV-Unidad Queretaro, Queretaro 76230, Mexico., Bushell A; Thermo Fisher Scientific (Surface Analysis), East Grinstead RH19 1XZ, United Kingdom., Herrera-Gómez A; CINVESTAV-Unidad Queretaro, Queretaro 76230, Mexico., Kurokawa A; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan., Thissen A; SPECS Surface Nano Analysis GmbH, Voltastraße 5, 13355 Berlin, Germany., Thomas AG; School of Materials, Photon Science Institute and Sir Henry Royce Institute, Alan Turing Building, University of Manchester, Oxford Road, Manchester M13 9PL, United Kingdom., Britton AJ; Versatile X-ray Spectroscopy Facility, School of Chemical and Process Engineering, University of Leeds, Leeds LS2 9JT, United Kingdom., Bernasik A; Academic Centre for Materials and Nanotechnology, AGH University of Science and Technology, 30-059 Kraków, Poland., Fuchs A; Robert Bosch GmbH, Robert-Bosch-Campus, 71272 Renningen, Germany., Baddorf AP; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, 1 Bethel Valley Road, Oak Ridge, Tennessee 37830., Bock B; Tascon GmbH, Mendelstr. 17, D-48149 Münster, Germany., Theilacker B; Medtronic, 710 Medtronic Parkway, LT240, Fridley, Minnesota 55432., Cheng B; Analysis and Testing Center, Beijing University of Chemical Technology, Beijing 100029, People's Republic of China., Castner DG; National ESCA and Surface Analysis Center for Biomedical Problems, Department of Bioengineering and Chemical Engineering, University of Washington, Seattle, Washington 98195., Morgan DJ; Cardiff Catalysis Institute, School of Chemistry, Cardiff University, Main Building, Cardiff CF10 3AT, United Kingdom., Valley D; Physical Electronics Inc., East Chanhassen, Minnesota 55317., Willneff EA; Versatile X-ray Spectroscopy Facility, School of Design, University of Leeds, Leeds LS2 9JT, United Kingdom., Smith EF; Nanoscale and Microscale Research Centre, University of Nottingham, Nottingham NG7 2RD, United Kingdom., Nolot E; CEA-LETI, 17 rue des Martyrs, 38054 Grenoble, France., Xie F; Instrumental Analysis & Research Center, Sun Yat-sen University, Guangzhou 510275, People's Republic of China., Zorn G; GE Research, 1 Research Circle, K1 1D7A, Niskayuna, New York 12309., Smith GC; Faculty of Science and Engineering, University of Chester, Thornton Science Park, Chester CH2 4NU, United Kingdom., Yasufuku H; Materials Analysis Station, National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, Ibaraki 305-0044, Japan., Fenton JL; Medtronic, 6700 Shingle Creek Parkway, Brooklyn Center, Minnesota 55430., Chen J; Instrumental Analysis & Research Center, Sun Yat-sen University, Guangzhou 510275, People's Republic of China., Counsell JDP; Kratos Analytical Ltd., Wharfside, Trafford Wharf Road, Manchester M17 1GP, United Kingdom., Radnik J; Bundesanstalt für Materialforschung und -prüfung (BAM), Unter den Eichen 44-46, 12203 Berlin, Germany., Gaskell KJ; Department of Chemistry and Biochemistry, University of Maryland, College Park, Maryland 20742., Artyushkova K; Physical Electronics Inc., East Chanhassen, Minnesota 55317., Yang L; Department of Chemistry, Xi'an Jiaotong-Liverpool University, 111 Ren'ai Road, Suzhou Dushu Lake Science and Education Innovation District, Suzhou Industrial Park, Suzhou 215123, People's Republic of China., Zhang L; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan., Eguchi M; Analysis Department, Materials Characterization Division, Futtsu Unit, Nippon Steel Technology Co. Ltd., 20-1 Shintomi, Futtsu City, Chiba 293-0011, Japan., Walker M; Department of Physics, University of Warwick, Coventry, West Midlands CV4 7AL, United Kingdom., Hajdyła M; Academic Centre for Materials and Nanotechnology, AGH University of Science and Technology, 30-059 Kraków, Poland., Marzec MM; Academic Centre for Materials and Nanotechnology, AGH University of Science and Technology, 30-059 Kraków, Poland., Linford MR; Department of Chemistry and Biochemistry, Brigham Young University, C100 BNSN, Provo, Utah 84602., Kubota N; Analysis Department, Materials Characterization Division, Futtsu Unit, Nippon Steel Technology Co. Ltd., 20-1 Shintomi, Futtsu City, Chiba 293-0011, Japan., Cortazar-Martínez O; CINVESTAV-Unidad Queretaro, Queretaro 76230, Mexico., Dietrich P; SPECS Surface Nano Analysis GmbH, Voltastraße 5, 13355 Berlin, Germany., Satoh R; Analysis Department, Materials Characterization Division, Futtsu Unit, Nippon Steel Technology Co. Ltd., 20-1 Shintomi, Futtsu City, Chiba 293-0011, Japan., Schroeder SLM; Versatile X-ray Spectroscopy Facility, School of Chemical and Process Engineering, University of Leeds, Leeds LS2 9JT, United Kingdom., Avval TG; Department of Chemistry and Biochemistry, Brigham Young University, C100 BNSN, Provo, Utah 84602., Nagatomi T; Platform Laboratory for Science and Technology, Asahi Kasei Corporation, 2-1 Samejima, Fuji, Shizuoka 416-8501, Japan., Fernandez V; Université de Nantes, CNRS, Institut des Matériaux Jean Rouxel, IMN, F-44000 Nantes, France., Lake W; Atomic Weapons Establishment (AWE), Aldermaston, Reading, Berkshire RG7 4PR, United Kingdom., Azuma Y; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan., Yoshikawa Y; Material Analysis Department, Yazaki Research and Technology Center, Yazaki Corporation, 1500 Mishuku, Susono-city, Shizuoka 410-1194, Japan., Shard AG; National Physical Laboratory, Hampton Road, Teddington TW11 0LW, United Kingdom.

Publikováno v: Journal of vacuum science & technology. A, Vacuum, surfaces, and films : an official journal of the American Vacuum Society [J Vac Sci Technol A] 2020 Dec; Vol. 38 (6), pp. 063208. Date of Electronic Publication: 2020 Nov 23.