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pro vyhledávání: '"Thakral, Kartik"'
Traditional deep learning models rely on methods such as softmax cross-entropy and ArcFace loss for tasks like classification and face recognition. These methods mainly explore angular features in a hyperspherical space, often resulting in entangled
Externí odkaz:
http://arxiv.org/abs/2408.02494
Autor:
Mittal, Surbhi, Thakral, Kartik, Singh, Richa, Vatsa, Mayank, Glaser, Tamar, Ferrer, Cristian Canton, Hassner, Tal
Artificial Intelligence (AI) has made its way into various scientific fields, providing astonishing improvements over existing algorithms for a wide variety of tasks. In recent years, there have been severe concerns over the trustworthiness of AI tec
Externí odkaz:
http://arxiv.org/abs/2310.15848
The presence of bias in deep models leads to unfair outcomes for certain demographic subgroups. Research in bias focuses primarily on facial recognition and attribute prediction with scarce emphasis on face detection. Existing studies consider face d
Externí odkaz:
http://arxiv.org/abs/2211.03588
Autor:
Narayan, Kartik, Agarwal, Harsh, Thakral, Kartik, Mittal, Surbhi, Vatsa, Mayank, Singh, Richa
Deepfake refers to tailored and synthetically generated videos which are now prevalent and spreading on a large scale, threatening the trustworthiness of the information available online. While existing datasets contain different kinds of deepfakes w
Externí odkaz:
http://arxiv.org/abs/2209.09111
Autor:
Malhotra, Aakarsh, Mittal, Surbhi, Majumdar, Puspita, Chhabra, Saheb, Thakral, Kartik, Vatsa, Mayank, Singh, Richa, Chaudhury, Santanu, Pudrod, Ashwin, Agrawal, Anjali
With increasing number of COVID-19 cases globally, all the countries are ramping up the testing numbers. While the RT-PCR kits are available in sufficient quantity in several countries, others are facing challenges with limited availability of testin
Externí odkaz:
http://arxiv.org/abs/2008.03205
Akademický článek
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Autor:
Malhotra, Aakarsh, Mittal, Surbhi, Majumdar, Puspita, Chhabra, Saheb, Thakral, Kartik, Vatsa, Mayank, Singh, Richa, Chaudhury, Santanu, Pudrod, Ashwin, Agrawal, Anjali
Publikováno v:
In Pattern Recognition February 2022 122
Akademický článek
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Publikováno v:
ACM International Conference Proceeding Series; 12/12/2019, p24-29, 6p