Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Thackeray, Jim"'
Autor:
Hohle, Christoph K., Gronheid, Roel, Du, Ke, Siauw, Meiliana, Valade, David, Jasieniak, Marek, Voelcker, Nico, Trefonas, Peter, Thackeray, Jim, Blakey, Idriss, Whittaker, Andrew
Publikováno v:
Proceedings of SPIE; March 2017, Vol. 10146 Issue: 1 p101460D-101460D-7, 913148p
Autor:
Gallatin, Gregg M., Naulleau, Patrick, Niakoula, Dimitra, Brainard, Robert, Hassanein, Elsayed, Matyi, Richard, Thackeray, Jim, Spear, Kathleen, Dean, Kim
Publikováno v:
Proceedings of SPIE; Nov2008, Issue 1, p69211E-69211E-11, 11p
Autor:
Hassanein, Elsayed, Higgins, Craig, Naulleau, Patrick, Matyi, Richard, Gallatin, Gregg, Denbeaux, Gregory, Antohe, Alin, Thackeray, Jim, Spear, Kathleen, Szmanda, Charles, Anderson, Christopher N., Niakoula, Dimitra, Malloy, Matthew, Khurshid, Anwar, Montgomery, Cecilia, Piscani, Emil C., Rudack, Andrew, Byers, Jeff, Ma, Andy, Dean, Kim
Publikováno v:
Proceedings of SPIE; Nov2008, Issue 1, p69211I-69211I-13, 13p
Autor:
Wallow, Thomas I., Hohle, Christoph K., Tate, Michael P., Cutler, Charlotte, Sakillaris, Mike, Kaufman, Michael, Estelle, Thomas, Mohler, Carol, Tucker, Chris, Thackeray, Jim
Publikováno v:
Proceedings of SPIE; March 2014, Vol. 9051 Issue: 1 p90510R-90510R-8, 814599p
Autor:
Ongayi, Owendi, Christianson, Matthew, Meyer, Matthew, Coley, Suzanne, Valeri, David, Kwok, Amy, Wagner, Mike, Cameron, Jim, Thackeray, Jim
Publikováno v:
Proceedings of SPIE; March 2012, Vol. 8322 Issue: 1 p83220T-83220T-12, 8238793p
Autor:
Cameron, James, Thackeray, Jim, Sung, Jin Wuk, Coley, Suzanne M., Jain, Vipul, Ongayi, Owendi, Wagner, Mike D., LaBeaume, Paul, Kwok, Amy, Valeri, David, Hellion, Marie, Icard, Béatrice, Dal'zotto, Bernard, Sourd, Claire, Pain, Laurent
Publikováno v:
Proceedings of SPIE; March 2012, Vol. 8322 Issue: 1 p83222F-83222F-12, 8238991p
Autor:
Naulleau, Patrick P., Ongayi, Owendi, Jain, Vipul, Coley, Suzanne M., Valeri, David, Kwok, Amy, Quach, Dung, Wagner, Mike, Cameron, Jim, Thackeray, Jim
Publikováno v:
Proceedings of SPIE; April 2013, Vol. 8679 Issue: 1 p867907-867907-11
Conference
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Autor:
Du, Ke, Siauw, Meiliana, Valade, David, Jasieniak, Marek, Voelcker, Nico, Trefonas, Peter, Thackeray, Jim, Blakey, Idriss, Whittaker, Andrew, Advances in Patterning Materials and Processes XXXIV 2017 San Jose, United States 27 February-2 March 2017
Out of band (OOB) radiation from the EUV source has significant implications for the performance of EUVL photoresists. Here we introduce a surface-Active polymer additive, capable of partitioning to the top of the resist film during casting and annea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1231::682d4871aa812c22cada7d19e33d46a4
https://hdl.handle.net/11541.2/128552
https://hdl.handle.net/11541.2/128552
Autor:
M. K.
Publikováno v:
America Magazine: The Jesuit Review of Faith & Culture. 6/18/1910, Vol. 3 Issue 10, p264-265. 2p.