Defects induced by solid state reactions at the tungsten-silicon carbide interface.

Autor: Tunhuma, S. M., Diale, M., Legodi, M. J., Nel, J. M., Thabete, T. T., Auret, F. D.

Publikováno v: Journal of Applied Physics; 2018, Vol. 123 Issue 16, pN.PAG-N.PAG, 7p, 1 Black and White Photograph, 2 Charts, 5 Graphs