Zobrazeno 1 - 10
of 139
pro vyhledávání: '"Thøgersen, Annett"'
Autor:
Thøgersen, Annett, Jensen, Ingvild J. T., Mehl, Torbjørn, Burud, Ingunn, Olsen, Espen, Gudem Ringdalen, Inga, Zhu, Junjie, Søndenå, Rune
Publikováno v:
Journal of Applied Physics; 4/7/2024, Vol. 135 Issue 13, p1-7, 7p
Autor:
Thøgersen Annett, Vines Lasse, Muntingh Georg, Prytz Øystein, von Wenckstern Holger, Jensen Ingvild Julie Thue
Publikováno v:
BIO Web of Conferences, Vol 129, p 24016 (2024)
Externí odkaz:
https://doaj.org/article/fe63a22b0b4d496ea86f52055b759289
Autor:
Thøgersen Annett, Dahl Øystein, Kadkhodazadeh Shima, Seifner Michael, Sunding Martin Fleissner, Svenum Ingeborg-Helene, Grandcolas Mathieu, Hansen Thomas Willum, Jensen Ingvild Julie Thue, Chatzitakis Athanasios
Publikováno v:
BIO Web of Conferences, Vol 129, p 25043 (2024)
Externí odkaz:
https://doaj.org/article/5380b73ebfc948718d5d049ebce068e9
Publikováno v:
In Journal of Physics and Chemistry of Solids November 2022 170
Autor:
Thøgersen, Annett, Muntingh, Georg
Publikováno v:
J. Appl. Phys. 113, 144301 (2013)
The effect of solar irradiation on plasmonic silver nanocrystals has been investigated using Transmission Electron Microscopy and size distribution analysis, in the context of solar cell applications for light harvesting. Starting from an initial col
Externí odkaz:
http://arxiv.org/abs/1212.0847
Autor:
Birenis, Domas, Ogawa, Yuhei, Matsunaga, Hisao, Takakuwa, Osamu, Yamabe, Junichiro, Prytz, Øystein, Thøgersen, Annett
Publikováno v:
In Materials Science & Engineering A 22 May 2019 756:396-404
Publikováno v:
J. Electrochem. Soc. 2012 volume 159, issue 5, D276-D281
Efficient anti-reflection coatings (ARC) improve the light collection and thereby increase the current output of solar cells. By simple electrochemical etching of the Si wafer, porous silicon (PS) layers with excellent broadband anti-reflection prope
Externí odkaz:
http://arxiv.org/abs/1210.0038
Publikováno v:
J. Appl. Phys. 109, 113532 (2011)
The atomic structure and composition of non-interfacial ITO and ITO-Si interfaces were studied with Transmission Electron Microscopy (TEM) and X-ray Photoelectron Spectroscopy (XPS). The films were deposited by DC magnetron sputtering on mono-crystal
Externí odkaz:
http://arxiv.org/abs/1210.0035
Autor:
Thøgersen, Annett, Mayandi, Jeyanthinath, Vines, Lasse, Sunding, Martin F., Olsen, Arne, Diplas, Spyros, Mitome, Masanori, Bando, Yoshio
Publikováno v:
J. Appl. Phys. 109, 084329 (2011)
The nucleation, distribution, composition and structure of Pd nanocrystals in SiO$_2$ multilayers containing Ge, Si, and Pd are studied using High Resolution Transmission Electron Microscopy (HRTEM) and X-ray Photoelectron Spectroscopy (XPS), before
Externí odkaz:
http://arxiv.org/abs/1210.0027
Autor:
Thøgersen, Annett, Mayandi, Jeyanthinath, Finstad, Terje, Olsen, Arne, Diplas, Spyros, Mitome, Masanori, Bando, Yoshio
Publikováno v:
J. Appl. Phys. 106, 014305 (2009)
The nucleation, distribution and composition of erbium embedded in a SiO$_2$-Si layer were studied with High Resolution Transmission Electron Microscopy (HRTEM), Electron Energy Loss Spectroscopy (EELS), Energy Filtered TEM (EFTEM), Scanning Transmis
Externí odkaz:
http://arxiv.org/abs/1210.0016