Zobrazeno 1 - 10
of 47
pro vyhledávání: '"Th, Wirth"'
Publikováno v:
Scientific Reports
For more than one century, hydrogen assisted degradation of metallic microstructures has been identified as origin for severe technical component failures but the mechanisms behind have not yet been completely understood so far. Any in-situ observati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4ee9505cf157bac359714c02ef886db2
Autor:
Werner Jordaan, M. van Staden, Th. Wirth, Vasile-Dan Hodoroaba, D. W. Moon, Sara Prins, D. Schmidt, K. J. Kim, Jeong Won Kim, Lulu Zhang, X. P. Song, Toshiyuki Fujimoto, Hai Wang, Th. Gross, Wolfgang E. S. Unger
Publikováno v:
Surface and Interface Analysis. 44:192-199
An international interlaboratory comparison of the measurement capabilities of four National Metrology Institutes (NMIs) and one Designated Institute (DI) in the determination of the chemical composition of thin Fe-Ni alloy films was conducted via a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4e0a01f1e1bfdde6dce683a24842e34c
https://doi.org/10.1002/sia.3795
https://doi.org/10.1002/sia.3795
Autor:
Wolfgang E. S. Unger, Riccardo Castelli, Peter H. Seeberger, Th. Wirth, Hyegeun Min, Tim Horlacher, Andreas Lippitz, A. G. Shard, Paul Dietrich, Th. Gross, Pierre-Luc Girard-Lauriault
Publikováno v:
Journal of Carbohydrate Chemistry. 30:361-372
A combined XPS, NEXAFS, and ToF-SIMS chemical surface characterization of carbohydrate-functionalized gold and glass surfaces is presented. Spot shape and chemical composition across a spot surface are provided by surface-sensitive methods as ToF-SIM
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::61240c7b5bc9ff9d49c173dfbcbc6216
https://doi.org/10.1080/07328303.2011.615181
https://doi.org/10.1080/07328303.2011.615181
Autor:
Vasile-Dan Hodoroaba, Andreas Hertwig, F. Straub, Th. Böllinghaus, Th. Wirth, Wolfgang E. S. Unger
Publikováno v:
Surface and Interface Analysis. 42:739-742
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) mappings provide a visualization of the distribution of chemical elements and phases on polished duplex steel surfaces as element and fragment secondary ion signals. The advantage of TOF-SIMS,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::91d27c91e8de8a0cf64cd37eb2ac5b4b
https://doi.org/10.1002/sia.3385
https://doi.org/10.1002/sia.3385
Publikováno v:
Zeitschrift für Orthopädie und ihre Grenzgebiete. 136:210-214
AIM In patients with congenital dislocation of the hip the assessment of the correct position of the hip joint after closed or open reduction is very difficult to make from the radiograph with the hips in plaster. As the delayed recognition of a recu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dfd589994a0ac8f0e42a66a29d130243
https://doi.org/10.1055/s-2008-1054224
https://doi.org/10.1055/s-2008-1054224
Autor:
Werner Österle, Mathias Senoner, Roman Sellin, Th. Wirth, I.N. Kaiander, Dieter Bimberg, Wolfgang E. S. Unger
Publikováno v:
Surface and Interface Analysis. 36:1423-1426
A new type of test sample for the determination of lateral resolution in surface analysis is presented. The certified reference material BAM-L002 ‘Nanoscale strip pattern for length calibration and testing of lateral resolution’ is an embedded cr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8d9cdf1ab961c04bde21404084291502
https://doi.org/10.1002/sia.1936
https://doi.org/10.1002/sia.1936
Autor:
R. Molajew, A. Tausche, G. Cherkaschinin, Th. Wirth, R. Werner, Sebastian Linke, Wolfgang E. S. Unger, W. Moritz
Publikováno v:
Sensor Letters. 9:662-664
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1bc26a3b02579b7070cf328c6b8f5344
https://doi.org/10.1166/sl.2011.1586
https://doi.org/10.1166/sl.2011.1586
Publikováno v:
Applied Spectroscopy. 53:987-990
At the performance of depth profiling by glow discharge optical emission spectroscopy (GD-OES) the intensities of optical emission lines of sample and sputter gas elements are measured in dependence on the time of sputtering. Radio-frequency (rf) spu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1e24074fe64b86ff6c1771895610f017
https://doi.org/10.1366/0003702991947658
https://doi.org/10.1366/0003702991947658
Publikováno v:
Journal of Physics D: Applied Physics
Journal of Physics D: Applied Physics, IOP Publishing, 2010, 43 (27), pp.275301. ⟨10.1088/0022-3727/43/27/275301⟩
Journal of Physics D: Applied Physics, IOP Publishing, 2010, 43 (27), pp.275301. ⟨10.1088/0022-3727/43/27/275301⟩
Recent advances in nanotechnology are a driving force for the improvement of lateral resolution in advanced analytical techniques such as scanning electron microscopy or scanning Auger microscopy (SAM). Special samples with multilayers which are perp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::438f2a0fd10e1f6c70cee32dd59e3e86
https://hal.archives-ouvertes.fr/hal-00569642/document
https://hal.archives-ouvertes.fr/hal-00569642/document
Autor:
Th. Wirth
Publikováno v:
Surface and Interface Analysis. 18:3-12
An extended matrix correction procedure is proposed which considers effects created by different atomic densities, electron backscattering, electron attenuation and peak shapes. Asymmetry factors are introduced that reflect line shape changes of sign
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::24f7b91242154a59ed833dc9557ff60e
https://doi.org/10.1002/sia.740180103
https://doi.org/10.1002/sia.740180103