Zobrazeno 1 - 10
of 68
pro vyhledávání: '"Teyssier, J.P."'
Publikováno v:
TARGET Days : from Ideas to Results, in the frame of the International Conference ISMOT-2007
TARGET Days : from Ideas to Results, in the frame of the International Conference ISMOT-2007, 2007, Roma, Italy
TARGET Days : from Ideas to Results, in the frame of the International Conference ISMOT-2007, 2007, Roma, Italy
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::9ad12511589954e37d2e53a96fc38586
https://hal.archives-ouvertes.fr/hal-00285318
https://hal.archives-ouvertes.fr/hal-00285318
Autor:
Charbonniaud, C., Gasseling, T., De Meyer, S., Quéré, R., Teyssier, J.P., Barataud, D., Nébus, J.M, Martin, T., Grimbert, B., Hoel, V., Caillas, N., Morvan, E.
Publikováno v:
Charbonniaud, C. ; Gasseling, T. ; De Meyer, S. ; Quéré, R. ; Teyssier, J.P. ; Barataud, D. ; Nébus, J.M ; Martin, T. ; Grimbert, B. ; Hoel, V. ; Caillas, N. ; Morvan, E. (2004) Power Performance Evaluation of AlGaN/GaN HEMTs through Load Pull and Pulsed I-V Measurements. In: Gallium Arsenide applications symposium. GAAS 2004, 11—12 Ottobre, Amsterdam.
A systematic evaluation of power performances of AlGaN/GaN HEMTs has been performed by means of CW on wafer Load Pull measurements at X band. Those measurements have been correlated to the results obtained through I-V and S-parameters pulsed measurem
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::176c33c5e9653fbdd871b66ea460f304
Publikováno v:
Bouysse, Ph. ; Barataud, D. ; Sommet, R. ; Teyssier, J.P. ; Nébus, J.M. ; Quéré, R. (2001) New trends in characterization and modeling of High Power devices. In: Gallium Arsenide applications symposium. Gaas 2001, 24-28 September 2001, London.
In this paper, we present some non exhaustive measurement techniques used for characterization and modeling of high power devices. Capabilities offered by pulsed measurements can be an efficient approach to deal with self-heating effects and sometime
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::818c35e63b2c34cc4810b5295cb7540d
Publikováno v:
Teyssier, J.P. ; Barataud, D. ; Laloue, A. ; Bouysse, Ph. ; Quere, R (1999) Nonlinear characterization of microwave transistors by the means of pulsed I(V) and pulsed S-Parameters measurements. In: Gallium Arsenide Applications Symposium. GAAS 1999, 4-5 October 1999, Bologna, Italy.
A versatile pulsed I(V) and 40 GHz pulsed S parameters measurement system of microwave transistors is described Capability of discrimination between thermal and trapping effects with a pulse set-up is demonstrated A method to measure electrically the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0dfce6c0d33b8f90a28f0d5e25254508
Publikováno v:
GaAs Gallium Arsenide Applications Symposium
GaAs Gallium Arsenide Applications Symposium, Oct 1998, Amsterdam, Netherlands. pp. 158-163, ⟨10.6092/unibo/amsacta/1541⟩
Barataud, D. ; Campovecchio, M. ; Teyssier, J.P. ; Nebus, J.M. ; Quéré, R. ; Obregon, J. (1998) New trends of nonlinear modeling for microwave devices in a circuit/system environment. In: Gallium Arsenide Applications Symposium. GAAS 1998, 5-6 October 1998, Amsterdam, The Netherlands.
GaAs Gallium Arsenide Applications Symposium, Oct 1998, Amsterdam, Netherlands. pp. 158-163, ⟨10.6092/unibo/amsacta/1541⟩
Barataud, D. ; Campovecchio, M. ; Teyssier, J.P. ; Nebus, J.M. ; Quéré, R. ; Obregon, J. (1998) New trends of nonlinear modeling for microwave devices in a circuit/system environment. In: Gallium Arsenide Applications Symposium. GAAS 1998, 5-6 October 1998, Amsterdam, The Netherlands.
Specific pulsed measurement techniques are presented to discriminate thermal and trapping effects during the modeling process. An electrothermal modeling approach, a new trap model and a specific nonlinear distributed topology are proposed. Moreover,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::07ed062f65c13150cec52c2b5e440021
https://hal-unilim.archives-ouvertes.fr/hal-01066973
https://hal-unilim.archives-ouvertes.fr/hal-01066973
Publikováno v:
Microwave Measurements Conference (ARFTG), 2010 75th ARFTG; 2010, p1-6, 6p
Autor:
Caller, G., Faraj, J., Rafei, A.E., Jardel, O., Jacquet, J.C., Teyssier, J.P., Morvan, E., Piotrowicz, S., Que?re, R.
Publikováno v:
Microwave Integrated Circuits Conference (EuMIC), 2010 European; 2010, p266-269, 4p
Autor:
Abouchahine, M., Saleh, A., Neveux, G., Reveyrand, T., Teyssier, J.P., Barataud, D., Nebus, J.M.
Publikováno v:
2009 IEEE MTT-S International Microwave Symposium Digest; 2009, p1201-1204, 4p
Publikováno v:
Microwave Measurement Symposium, 2009 74th ARFTG; 2009, p1-6, 6p
Autor:
Jardel, O., De Groote, F., Charbonniaud, C., Reveyrand, T., Teyssier, J.P., Quere, R., Floriot, D.
Publikováno v:
2007 IEEE/MTT-S International Microwave Symposium; 2007, p601-604, 4p