Zobrazeno 1 - 10
of 62
pro vyhledávání: '"Test complexity"'
Autor:
Teka B, Gizaw M, Firdawoke E, Addissie A, Sisay TA, Schreckenberger C, Skof AS, Thies S, Mihret A, Kantelhardt EJ, Abebe T, Kaufmann AM
Publikováno v:
Cancer Management and Research, Vol Volume 14, Pp 2253-2263 (2022)
Brhanu Teka,1,2 Muluken Gizaw,2– 4 Ededia Firdawoke,1 Adamu Addissie,3 Tesfamichael Awoke Sisay,3 Carola Schreckenberger,5 Anna Sophie Skof,5 Sarah Thies,5 Adane Mihret,1,6 Eva Johanna Kantelhardt,2,4 Tamrat Abebe,1 Andreas M Kaufmann5 1Department
Externí odkaz:
https://doaj.org/article/a3ed09b412bb4920baae97c00117ba48
Publikováno v:
Medical Clinics of North America. 103:967-976
Historically, both pretest and posttest genetic counseling has been standard of care for genetic testing. This model should be adapted for primary care providers (PCPs) willing to learn critical information about the test and key concepts that patien
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6fdde3a872b6e641675f5a40aa911eac
https://doi.org/10.1016/j.mcna.2019.07.001
https://doi.org/10.1016/j.mcna.2019.07.001
Autor:
Rolf Drechsler, Sebastian Huhn
Publikováno v:
Design for Testability, Debug and Reliability ISBN: 9783030692087
SoCs are now widely used in the semiconductor industry to fulfill the challenging functional requirements of nowadays application scenarios. This inevitably leads to higher test complexity since comprehensive test scenarios have to be considered for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::887aea341bd44b8158f101023b1fc137
https://doi.org/10.1007/978-3-030-69209-4_5
https://doi.org/10.1007/978-3-030-69209-4_5
Autor:
Viet-Thanh Pham, Adel Ouannas, Giuseppe Grassi, Amina-Aicha Khennaoui, Reyad El-Khazali, Shaher Momani, Duy Vo Hoang
Publikováno v:
Electronics
Volume 9
Issue 5
Electronics, Vol 9, Iss 748, p 748 (2020)
Volume 9
Issue 5
Electronics, Vol 9, Iss 748, p 748 (2020)
Fractional calculus in discrete-time systems is a recent research topic. The fractional maps introduced in the literature often display chaotic attractors belonging to the class of &ldquo
self-excited attractors&rdquo
The field of fractiona
self-excited attractors&rdquo
The field of fractiona
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4c1cee9274a595930ab431f0651616c6
Autor:
Zhao Jinbo, Tan Ke
Publikováno v:
2018 International Conference on Power System Technology (POWERCON).
This paper studies the optimization measures based on the operational DCS test strategy widely used in the second generation Nuclear Power Plant (NPP), to meet the more complex operational DCS test demands for the third generation NPP. The operationa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6e05c29556a943234bda73bf3e3707f3
https://doi.org/10.1109/powercon.2018.8602268
https://doi.org/10.1109/powercon.2018.8602268
Pseudo-Exhaustive Random Access Memory Testing Based on March Tests with Random Background Variation
Publikováno v:
EWDTS
Studying the efficiency of memory system tests, we have to take into consideration the complexity of generating all 2k combinations for k memory cells, which is an essential and in many cases sufficient condition, which allows detecting different com
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f9fc63906d68adbc42316cccc6cd829a
https://doi.org/10.1109/ewdts.2018.8524824
https://doi.org/10.1109/ewdts.2018.8524824
Akademický článek
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Autor:
Imran Wali, Marcello Traiola, Arnaud Virazel, Patrick Girard, Mario Barbareschi, Alberto Bosio
Publikováno v:
3rd Workshop On Approximate Computing In conjunction with HiPEAC
WAPCO: Workshop On Approximate Computing
WAPCO: Workshop On Approximate Computing, Jan 2017, Stockholm, Sweden
HAL
WAPCO: Workshop On Approximate Computing
WAPCO: Workshop On Approximate Computing, Jan 2017, Stockholm, Sweden
HAL
International audience; In the recent years Approximate Computing (AC) has emerged as new paradigm for energy efficient IC design. It addresses the problem of maintaining reliability and thus coping with run-time errors exploiting an acceptable amoun
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::04680f4cad5ca540e3ef5c98e4df27da
https://hal-lirmm.ccsd.cnrs.fr/lirmm-02004418/document
https://hal-lirmm.ccsd.cnrs.fr/lirmm-02004418/document
Autor:
Mario Barbareschi, Marcello Traiola, Imran Wali, Patrick Girard, Alberto Bosio, Arnaud Virazel
Publikováno v:
DDECS
20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems
DDECS: Design and Diagnostics of Electronic Circuits and Systems
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2017, Dresden, Germany. ⟨10.1109/DDECS.2017.7934574⟩
20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems
DDECS: Design and Diagnostics of Electronic Circuits and Systems
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2017, Dresden, Germany. ⟨10.1109/DDECS.2017.7934574⟩
International audience; In the recent years, Approximate Computing (AC) has emerged as a new paradigm for energy efficient design of Integrated Circuits (ICs). AC is based on the intuitive observation that, while performing exact computation requires
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9e3153da3da002cc7ce9260637c69f11
https://hdl.handle.net/11588/915813
https://hdl.handle.net/11588/915813
Autor:
Geary, Niall
This research has explored the relationship between system test complexity and tacit knowledge. It is proposed as part of this thesis, that the process of system testing (comprising of test planning, test development, test execution, test fault analy
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1535::4a0bddbdaa6bfaf4f5ed34c23e8f1a28
https://hdl.handle.net/10468/3113
https://hdl.handle.net/10468/3113