Comparison of xenon and gallium sources on the detection and mapping of lithium in Li‐containing materials by using ToF‐SIMS combined FIB‐SEM.

Autor: DERMENCI, K.B.¹ (AUTHOR) kbdermenci@eskisehir.edu.tr, TESAŘOVÁ, H.² (AUTHOR), ŠAMOŘIL, T.² (AUTHOR), TURAN, S.¹ (AUTHOR)

Publikováno v: Journal of Microscopy. Jan2020, Vol. 277 Issue 1, p42-48. 7p. 1 Color Photograph, 1 Diagram, 1 Graph.

Depth Profile Analysis of Thin Oxide Layers on Polycrystalline Fe-Cr.

Autor: Zijlstra G; Department of Applied Physics, Materials Innovation Institute and Zernike Institute for Advanced Materials, University of Groningen, Nijenborgh 4, 9747 AGGroningen, the Netherlands., Šamořil T; TESCAN ORSAY HOLDING, a.s., Libušina tř. 21, 623 00Brno, Czech Republic., Tesařová H; TESCAN ORSAY HOLDING, a.s., Libušina tř. 21, 623 00Brno, Czech Republic., Ocelík V; Department of Applied Physics, Materials Innovation Institute and Zernike Institute for Advanced Materials, University of Groningen, Nijenborgh 4, 9747 AGGroningen, the Netherlands., De Hosson JTM; Department of Applied Physics, Materials Innovation Institute and Zernike Institute for Advanced Materials, University of Groningen, Nijenborgh 4, 9747 AGGroningen, the Netherlands.

Publikováno v: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2020 Feb; Vol. 26 (1), pp. 112-119.

3D SIMULATION TOOL FOR EVALUATION OF ERGONOMICS AT WORK.

Autor: Nejedlá, M., Tesařová, H.

Publikováno v: Vlakna a Textil; 2013, Issue 20, p28-40, 13p

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Tracking lithiation with transmission electron microscopy.

Autor: Lei, Xincheng, Zhao, Jianxiong, Wang, Jiayi, Su, Dong

Publikováno v: SCIENCE CHINA Chemistry; Jan2024, Vol. 67 Issue 1, p291-311, 21p