Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Teo Kim Hong"'
Publikováno v:
Journal of Management Development, 1990, Vol. 9, Issue 5, pp. 51-57.
Externí odkaz:
http://www.emeraldinsight.com/doi/10.1108/02621719010145209
Autor:
Chen Changqing, Teo Kim Hong, Yogaspari, Liu Binghai, Lee Gek Li, Robin Tan, Tee Irene, Chen Ye, Mo Zhiqiang, Ang Ghim Boon, Yao Yuan, Zhao Si Ping
Publikováno v:
International Symposium for Testing and Failure Analysis.
Abnormal inline defects were caught after nitride spacer etching processes. Detailed MEBES layout checking and inline SEM inspection revealed that such defects always appeared at the boundaries in between PFETs and NFETs regions. The microstructure a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2de068e2587444f5410fd12980720667
https://doi.org/10.31399/asm.cp.istfa2012p0574
https://doi.org/10.31399/asm.cp.istfa2012p0574
Publikováno v:
Journal of Management Development. 9:51-57
Managers working for multinational companies need to be culturally sensitive, as do those responsible for training methods and materials in different cultural settings. The issues associated with the effectiveness of applying training and development
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6ad7d00a3e18baadb4deb4bddc47541e
https://doi.org/10.1108/02621719010145209
https://doi.org/10.1108/02621719010145209