Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Teny Shih"'
Publikováno v:
IMAPSource Proceedings. 2022
As the industry moves forward the age of more than Moore, the next generation of packaging moves forward high density of chiplet or die splitting package integration. Especially for high performance computing applications, the advance packaging is to
Publikováno v:
2023 International Conference on Electronics Packaging (ICEP).
Publikováno v:
2022 IEEE 24th Electronics Packaging Technology Conference (EPTC).
Publikováno v:
2021 IEEE 23rd Electronics Packaging Technology Conference (EPTC).
Publikováno v:
ASME 2021 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems.
In the present generation, internet with instant data access brings up the demands of high speed Ethernet. Development of 400G Ethernet is currently underway. There are two common coding schemes: non-return-to-zero (NRZ) and pulse-amplitude modulatio
Autor:
Yu Po Wang, Andrew Kang, Ying Wei Lu, Don Son Jiang, Pai Yu Cheng, Teny Shih, Po Yuan Su, David Lai
Publikováno v:
ASME 2020 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems.
From the fifth-generation (5G) of system architecture evolution, there are more and more demands which require high data rate communication, low latency, and massive connectivity for network data transmission. For millimeter-wave (mm-wave), communica
Autor:
C. Key Chung, P.J. Su, Teny Shih, Chun-Tang Lin, Nistec Chang, Yu-Po Wang, Joseph Hung, Nicholas Kao
Publikováno v:
2020 IEEE 70th Electronic Components and Technology Conference (ECTC).
During last couple years, the market of IC packag successful to implement Cu pillar Bump as a mainstream of high density flip chip packaging solution in each of product application market. High performance computing product requires advanced Si node,
Autor:
Shih Ching Chen, Chung Chih Yen, Teny Shih, Cheng Hao Ciou, Ching Yu Huang, Wei Jen Chang, Chen Kuang Hsin, Ching-Wen Chiang, Hsien Wen Chen, Kang Wei Peng
Publikováno v:
2015 IEEE 65th Electronic Components and Technology Conference (ECTC).
Through silicon via (TSV) is one of the key technologies in 2.5D and 3D electronic package. When the different materials and processes are used in TSV structure, the warpage, via depth variation and silicon TTV are challenges on backside via reveal p