Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Tengzhang Liu"'
Autor:
Xiongfeng Wang, Zhenyi Guo, Weiying Zheng, Zhiquan Liu, Tengzhang Liu, Xiaopei Chen, Peimian Cai, Qiyan Zhang, Wugang Liao
Publikováno v:
APL Materials, Vol 12, Iss 11, Pp 111105-111105-10 (2024)
This study delves into the characterization of IGZO/ZnO bilayer memristors, examining the impact of ZnO thickness and voltage scan rate on device performance. Bilayer memristors with varying ZnO thicknesses were prepared using magnetron sputtering, a
Externí odkaz:
https://doaj.org/article/734861fbb3774563bed49220c61e15d2
Autor:
Xin Huang, Qinghu Bai, Yang Guo, Qijie Liang, Tengzhang Liu, Wugang Liao, Aizi Jin, Baogang Quan, Haifang Yang, Baoli Liu, Changzhi Gu
Publikováno v:
Nanomaterials, Vol 14, Iss 23, p 1936 (2024)
Besides the intensity and wavelength, the ability to analyze the optical polarization of detected light can provide a new degree of freedom for numerous applications, such as object recognition, biomedical applications, environmental monitoring, and
Externí odkaz:
https://doaj.org/article/ef809fafc8c74539a1653d86866fa3ea