Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Teng Zhongjian"'
Autor:
Luc Thomas, Jesmin Haq, Ru-Ying Tong, Teng Zhongjian, Shen Dongna, Hideaki Fukuzawa, Po-Kang Wang, Guenole Jan, Son Thai Le, Vignesh Sundar, Vinh Lam, Yu-Jen Wang, Jian Zhu, Renren He, Yang Yi, Tom Zhong, Santiago Serrano-Guisan, Paul Y. Liu, Huanlong Liu, Sahil Patel, Yuan-Jen Lee, Jodi Iwata-Harms
Publikováno v:
Scientific Reports, Vol 9, Iss 1, Pp 1-7 (2019)
Scientific Reports
Scientific Reports
Perpendicular magnetic anisotropy (PMA) ferromagnetic CoFeB with dual MgO interfaces is an attractive material system for realizing magnetic memory applications that require highly efficient, high speed current-induced magnetic switching. Using this
Akademický článek
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Autor:
Tom Zhong, Santiago Serrano-Guisan, Jesmin Haq, Jodi Iwata-Harms, Guenole Jan, Sahil Patel, Teng Zhongjian, Yuan-Jen Lee, Renren He, Son T. Le, Yang Yi, Paul Liu, Vignesh Sundar, Shen Dongna, Luc Thomas, Ru-Ying Tong, Vinh Lam, Yu-Jen Wang, Jian Zhu, Hideaki Fukuzawa, Po-Kang Wang, Huanlong Liu
Publikováno v:
2018 IEEE International Electron Devices Meeting (IEDM).
Last-Level-Cache applications at OX technology nodes require devices switching reliably in less than 10ns at currents smaller than 50uA, while preserving data retention up to 85°C. In this paper, we show that both low Gilbert damping and low magneti
Autor:
Son T. Le, Santiago Serrano-Guisan, Sahil Patel, Jesmin Haq, Vinh Lam, Shen Dongna, Tom Zhong, Renren He, Yang Yi, Vignesh Sundar, Po-Kang Wang, Guenole Jan, Yu-Jen Wang, Jian Zhu, Huanlong Liu, Paul Liu, Yuan-Jen Lee, Luc Thomas, Ru-Ying Tong, Jodi Iwata-Harms, Teng Zhongjian
Publikováno v:
2017 IEEE International Electron Devices Meeting (IEDM).
Scaling STT-MRAM cells beyond 1X technology nodes will require MTJ devices smaller than 30 nm. For such small sizes, process-induced damage becomes a primary factor of device performance. A robust method of assessing magnetic properties of sub-30 nm
Autor:
Vignesh Sundar, Yang Yi, Yu-Jen Wang, Jian Zhu, Vinh Lam, Shen Dongna, Jesmin Haq, Guenole Jan, Tom Zhong, Po-Kang Wang, Son T. Le, Sahil Patel, Renren He, Huanlong Liu, Santiago Serrano-Guisan, Paul Liu, Yuan-Jen Lee, Jodi Iwata-Harms, Luc Thomas, Ru-Ying Tong, Teng Zhongjian
Publikováno v:
2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S).
Spin-Transfer-Torque Magnetic Random Access Memory (STT-MRAM) is emerging as a leading candidate for a variety of embedded memory applications ranging from embedded NVM to working memory and last level cache. In this paper, we review recent breakthro
Autor:
Guenole Jan, Luc Thomas, Ru-Ying Tong, Terry Torng, Jesmin Haq, Tom Zhong, Shen Dongna, Son T. Le, Rao Annapragada, Teng Zhongjian, Renren He, Po-Kang Wang, K. Pi, Santiago Serrano-Guisan, Yu-Jen Wang, Jian Zhu, Huanlong Liu, Vinh Lam, Yuan-Jen Lee
Publikováno v:
2015 IEEE International Electron Devices Meeting (IEDM).
Current understanding of thermal stability of perpendicular STT-MRAM based on device-level data suggests that the thermal stability factor A is almost independent of device diameter above ∼30nm. Here we report that contrary to this conventional wis
Publikováno v:
2012 International Conference on Systems & Informatics (ICSAI2012); 1/ 1/2012, p1878-1881, 4p
Autor:
Lin Yang, Teng Zhongjian
Publikováno v:
2011 IEEE 3rd International Conference on Communication Software & Networks (ICCSN); 2011, p171-174, 4p
Autor:
Lin Yang, Teng Zhongjian
Publikováno v:
2009 International Conference on Computational Intelligence & Software Engineering; 2009, p1-4, 4p
Autor:
Thomas, Luc, Jan, Guenole, Le, Son, Lee, Yuan-Jen, Liu, Huanlong, Zhu, Jian, Serrano-Guisan, Santiago, Tong, Ru-Ying, Pi, Keyu, Shen, Dongna, He, Renren, Haq, Jesmin, Teng, Zhongjian, Annapragada, Rao, Lam, Vinh, Wang, Yu-Jen, Zhong, Tom, Torng, Terry, Wang, Po-Kang
Publikováno v:
2015 IEEE International Electron Devices Meeting (IEDM); 1/1/2015, p1.4-26.4.4, 0p