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pro vyhledávání: '"Teng Wenyi"'
Publikováno v:
2019 14th IEEE International Conference on Electronic Measurement & Instruments (ICEMI).
Traditional feature extraction methods for analog circuits incipient fault diagnosis rely on signal processing technology and expert experience, the diagnostic accuracy for incipient faults is not satisfactory. To deal with these problems, a novel ap
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::37d8a40d0816210dfeaadd6b22368b10
https://doi.org/10.1109/icemi46757.2019.9101841
https://doi.org/10.1109/icemi46757.2019.9101841
