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of 2
pro vyhledávání: '"Teddy G. Ajero"'
Autor:
Denis Fellmann, Stephen E. Mick, John Damiano, Clinton S. Potter, David P. Nackashi, Bridget Carragher, Joel Quispe, Teddy G. Ajero
Publikováno v:
Microscopy and Microanalysis. 13:365-371
Two issues that often impact the cryo-electron microscopy (cryoEM) specimen preparation process are agglomeration of particles near hole edges in holey carbon films and variations in vitreous ice thickness. In many cases, the source of these issues w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c655127b0e8907e5f4199d49506fdb4a
https://doi.org/10.1017/s1431927607070791
https://doi.org/10.1017/s1431927607070791
Autor:
Joel Quispe, John Damiano, Stephen E. Mick, David P. Nackashi, Denis Fellmann, Teddy G. Ajero, Bridget Carragher, Clinton S. Potter
Publikováno v:
Microscopy & Microanalysis; Oct2007, Vol. 13 Issue 5, p365-371, 7p