Zobrazeno 1 - 10 of 28 pro vyhledávání: '"Ted Wang"'
1
Akademický článek
Monitoring of FinFET Characteristics Using $\Delta V_{\text{DIBLSS}}/(I_{\text{on}}/I_{\text{off}})$ and $\Delta V_{\text{DIBL}}/(I_{\text{on}}/I_{\text{off}})$
Autor: Yi-Chuen Eng, Luke Hu, Tzu-Feng Chang, Chih-Yi Wang, Steven Hsu, Osbert Cheng, Chien-Ting Lin, Yu-Shiang Lin, Zen-Jay Tsai, Ted Wang, Touber Tseng, Chih-Wei Yang, Chin-Yang Hsieh
Publikováno v: IEEE Journal of the Electron Devices Society, Vol 7, Pp 344-350 (2019)
In this paper, we present a descriptive analysis of a performance index, ΔVDIBLSS/(Ion/Ioff), used for performance monitoring. Scaled nand p-channel metal-oxide-semiconductor field-effect transistors (MOSFETs) (planar and FinFET devices) are include
Externí odkaz: https://doaj.org/article/2e9d78736c3a4004851369e53028e38c
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2
Akademický článek
Importance of $\Delta V_{{\text {DIBLSS}}}/({I}_{{\text {on}}} /{I}_{{\text {off}}})$ in Evaluating the Performance of n-Channel Bulk FinFET Devices
Autor: Yi-Chuen Eng, Luke Hu, Tzu-Feng Chang, Steven Hsu, Chun Mao Chiou, Ted Wang, Chih-Wei Yang, Osbert Cheng, Chih-Yi Wang, C. S. Tseng, Ren Huang, Po-Hsieh Lin, Kuan-Yu Lu, I-Fan Chang, Chi-Ju Lee, Yen-Liang Wu, Mike Chang
Publikováno v: IEEE Journal of the Electron Devices Society, Vol 6, Pp 207-213 (2018)
This paper aims to investigate the recently proposed figure of merit, ΔVDIBLSS/(Ion/Ioff), in detail. Experimental results show that ΔVDIBLSS/(Ion/Ioff) represents the index of device immunity to short-channel effects in bulk FinFETs. The value of
Externí odkaz: https://doaj.org/article/828ad9d5138e4529a144a668d7ba1fcf
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3
Akademický článek
A New Figure of Merit, ${\Delta V_{\text {DIBLSS}} /(I_{\rm {d},{\mathrm{ sat}}} /I_{\rm {sd},{\mathrm{ leak}}} )}$ , to Characterize Short-Channel Performance of a Bulk-Si n-Channel FinFET Device
Autor: Yi-Chuen Eng, Luke Hu, Tzu-Feng Chang, Steven Hsu, Chun Mao Chiou, Ted Wang, Chih-Wei Yang, Chien-Ting Lin, I-Chang Wang, Ming-Chih Chen, Andy Lai, Pei-Wen Wang, Chia-Jung Hsu, Wen-Yuan Pang, Chin-Hao Kuo, Osbert Cheng, Chih-Yi Wang
Publikováno v: IEEE Journal of the Electron Devices Society, Vol 5, Iss 1, Pp 18-22 (2017)
This paper aims to investigate the device parameters, including drain-induced barrier lowering (DIBL), subthreshold swing (SS), and saturation drive current, Id,sat, of bulk-Si n-channel FinFET devices (bulk n-FinFETs). The impact of lightly doped dr
Externí odkaz: https://doaj.org/article/9275c6569a6b4258847de41cceafc9ec
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4
Monitoring of FinFET Characteristics Using $\Delta V_{\text{DIBLSS}}/(I_{\text{on}}/I_{\text{off}})$ and $\Delta V_{\text{DIBL}}/(I_{\text{on}}/I_{\text{off}})$
Autor: Yi-Chuen Eng, Luke Hu, Tzu-Feng Chang, Chih-Yi Wang, Steven Hsu, Osbert Cheng, Chien-Ting Lin, Yu-Shiang Lin, Zen-Jay Tsai, Ted Wang, Touber Tseng, Chih-Wei Yang, Chin-Yang Hsieh
Publikováno v: IEEE Journal of the Electron Devices Society, Vol 7, Pp 344-350 (2019)
In this paper, we present a descriptive analysis of a performance index, ΔVDIBLSS/(Ion/Ioff), used for performance monitoring. Scaled nand p-channel metal-oxide-semiconductor field-effect transistors (MOSFETs) (planar and FinFET devices) are include
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doajarticles::d6d39b2f01ae87afef03ba4b284e58f4
https://ieeexplore.ieee.org/document/8640085/
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5
Importance of $\Delta V_{{\text {DIBLSS}}}/({I}_{{\text {on}}} /{I}_{{\text {off}}})$ in Evaluating the Performance of n-Channel Bulk FinFET Devices
Autor: Luke Hu, Chih-Yi Wang, Po-Hsieh Lin, Ted Wang, Lee Chi-Ju, Mike Chang, Yi-Chuen Eng, Chun Mao Chiou, Tzu-Feng Chang, Steven Hsu, Ren Huang, Kuan-Yu Lu, Yen-Liang Wu, Chang I-Fan, C. S. Tseng, Chih-Wei Yang, Osbert Cheng
Publikováno v: IEEE Journal of the Electron Devices Society, Vol 6, Pp 207-213 (2018)
This paper aims to investigate the recently proposed figure of merit, $\Delta V_{\mathrm{ DIBLSS}} /(I_{\mathrm{ on}} /I_{\mathrm{ off}})$ , in detail. Experimental results show that $\Delta V_{\mathrm{ DIBLSS}} /(I_{\mathrm{ on}} /I_{\mathrm{ off}})
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c09cf2fd14f9d635bdb8ec05b2eaec50
https://ieeexplore.ieee.org/document/8247186/
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6
A New Figure of Merit, ${\Delta V_{\text {DIBLSS}} /(I_{\rm {d},{\mathrm{ sat}}} /I_{\rm {sd},{\mathrm{ leak}}} )}$ , to Characterize Short-Channel Performance of a Bulk-Si n-Channel FinFET Device
Autor: Chien-Ting Lin, Yi-Chuen Eng, Chin-Hao Kuo, Steven Hsu, Osbert Cheng, Chia-Jung Hsu, Ted Wang, Chen Ming-Chih, Pei-Wen Wang, Chih-Wei Yang, Chih-Yi Wang, Chun Mao Chiou, I-Chang Wang, Tzu-Feng Chang, Andy Lai, Wen-Yuan Pang, Luke Hu
Publikováno v: IEEE Journal of the Electron Devices Society, Vol 5, Iss 1, Pp 18-22 (2017)
This paper aims to investigate the device parameters, including drain-induced barrier lowering (DIBL), subthreshold swing (SS), and saturation drive current, $I_{\rm d,{\mathrm{ sat}}} $ , of bulk-Si n-channel FinFET devices (bulk n-FinFETs). The imp
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d51dea5cecf1e80f3955636957a06ec0
https://doi.org/10.1109/jeds.2016.2626464
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7
Maintaining Key Services While Retaining Core Values: NYC Transit’s Environmental Justice Strategies
Autor: Alla Reddy, Alex Lu, Ted Wang
Publikováno v: Journal of Public Transportation. 16:123-152
In a recession, transit agencies aim to provide key services while retaining national core values. When making service changes, federal funding recipients are prohibited from discriminating on the basis of race, color, or national origin and must not
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::bd43a3b583d3d4c7d68064021ae4deeb
https://doi.org/10.5038/2375-0901.16.1.7
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8
Subway Productivity, Profitability, and Performance
Autor: Ted Wang, Alex Lu, Alla Reddy
Publikováno v: Transportation Research Record: Journal of the Transportation Research Board. 2143:48-58
Detailed comparative analyses of New York City subways and four Southeast Asian transit systems revealed that Hong Kong's subways are profitable because of high asset productivity resulting from a strategic “prudent commercial” design for high ut
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::65ea653a10c69dd6592e9271ae7032eb
https://doi.org/10.3141/2143-07
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9
Risk of proarrhythmic events in the atrial fibrillation follow-up investigation of rhythm management (AFFIRM) study
Autor: Patrick D. Barrell, George W. Dennish, Paul A. Zimmermann, Ted Wang, Elizabeth S. Kaufman, Mary L. Chandler, H. Leon Greene, Affirm Investigators
Publikováno v: Journal of the American College of Cardiology. 44:1276-1282
Objectives This study examined the risk of proarrhythmic events in patients receiving antiarrhythmic drugs for treatment of atrial fibrillation (AF) according to present-day safety guidelines. Background Advances in understanding the proarrhythmic ri
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ea09c73317797d6fa3522fc3e736b5f3
https://doi.org/10.1016/j.jacc.2004.06.052
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