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pro vyhledávání: '"Tchernaiev, A."'
Publikováno v:
COMPEL -The international journal for computation and mathematics in electrical and electronic engineering, 1993, Vol. 12, Issue 4, pp. 531-539.
Externí odkaz:
http://www.emeraldinsight.com/doi/10.1108/eb051826
Publikováno v:
COMPEL - The international journal for computation and mathematics in electrical and electronic engineering. 12:531-539
Self‐consistent electrothermal simulation of modern semiconductor devices is required for the accurate and efficient design and optimization of many semiconductor devices. The need to perform this type analysis in order to predict the behavior of p