Zobrazeno 1 - 10
of 11
pro vyhledávání: '"Tatsuya Iwabuchi"'
Work function modulation of electrodes contacted to molybdenum disulfide using an attached metal pad
Publikováno v:
AIP Advances, Vol 9, Iss 8, Pp 085118-085118-5 (2019)
The transport properties of electronic devices fabricated using two-dimensional materials are severely affected by the Schottky barrier at the contact of an electrode. The Schottky barrier height exhibits a strong correlation with the work function o
Externí odkaz:
https://doaj.org/article/07a5f138e1cf4a1f824401e4c3f54b95
Autor:
Kazuhiro YAMAMOTO, Makoto MOTOMIYA, Shimon NASU, Shinya OOMOTO, Hisashi KOISHI, Naoya WATANABE, Keigo YASUI, Tatsuya IWABUCHI
Publikováno v:
JOURNAL OF THE JAPANESE ASSOCIATION OF RURAL MEDICINE. 70:636-642
Publikováno v:
ChemNanoMat. 4:1078-1082
The interface between two-dimensional semiconductors and metal contacts is an important topic of research of nanoelectronic devices based on two-dimensional semiconducting materials such as molybdenum disulfide (MoS2). We report transport properties
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3bccc032f02946428d99f15be68cf890
http://arxiv.org/abs/1712.05628
http://arxiv.org/abs/1712.05628
Publikováno v:
Physics Letters A. 384(3):126073
Hall effect measurements conventionally rely on the use of dc magnetic fields. For electronic devices made of ultrathin semiconducting materials, such as molybdenum disulfide (MoS2), the dc Hall effect measurements have practical difficulties. Here,
Publikováno v:
The Proceedings of the Symposium on Motion and Power Transmission. 2013:250-254
Publikováno v:
ChemNanoMat. 4:1021-1021
Publikováno v:
Journal of Physics: Conference Series. 969:012105
Autor:
Yutaro Fujisawa, Yoshihiro Shimazu, Kazuya Suzuki, Daiki Kurihara, Masaya Takanashi, Tatsuya Iwabuchi, Kensuke Arai
Publikováno v:
Advanced Materials Interfaces. 4:1700631
Misfit layer compounds consist of two sublattices that are incommensurately modulated. These sublattices have the structures of cubic monochalcogenide and transition-metal dichalcogenide monolayers. In this work, a semiconducting misfit layer compoun
Publikováno v:
The Proceedings of Mechanical Engineering Congress, Japan. 2015:G0800103