Zobrazeno 1 - 10
of 12
pro vyhledávání: '"Tatsuya Asahata"'
Publikováno v:
Journal of Alloys and Compounds. 577:S717-S721
In order to improve microstructure analysis with electron microscopes, we have developed an instrument that is based on a combination of a scanning electron microscope (SEM) and a focused ion beam (FIB). The most characteristic point is that the SEM
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::88297921d264140323c13abd90408f92
https://doi.org/10.1016/j.jallcom.2012.02.019
https://doi.org/10.1016/j.jallcom.2012.02.019
Autor:
Takashi Kaito, Masanao Munekane, Toshiharu Kogure, Yukimitsu Kijima, Tatsuya Asahata, Masakatsu Hasuda, Toshitada Takeuchi, Toshiaki Fujii, Koji Iwasaki, Masahiro Kiyohara
Publikováno v:
Journal of Micromechanics and Microengineering. 15:S286-S291
A focused ion beam (FIB) system is process equipment used to make a wide variety of small structures of various materials by irradiating a focused gallium ion beam of nanometer-order diameter to a surface of specimens and by utilizing spattering etch
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9650020bf5206e8fe3fd8187a6ab502a
https://doi.org/10.1088/0960-1317/15/10/s06
https://doi.org/10.1088/0960-1317/15/10/s06
Publikováno v:
Surface Review and Letters. :1811-1821
Three different experimental approaches have been developed to study the dynamic process of subsurface altered layer formation in a Cu-Pt alloy under Ar + ion bombardment: (1) sputter neutral mass spectrometry by multiphoton ionization (MPI-SNMS) for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4eb9892b781f997f536f5653258c9f14
https://doi.org/10.1142/s0218625x96002746
https://doi.org/10.1142/s0218625x96002746
Publikováno v:
Surface and Interface Analysis. 21:56-60
The effect of cooling on the development of the altered layer in a Cu-Pt alloy under Ar + ion bombardment has been studied through the accurate determination of the compositional profiles in the near-surface region by sequential ISSAES measurements a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ecacf7c20edb1346daa747be5ad66836
https://doi.org/10.1002/sia.740210109
https://doi.org/10.1002/sia.740210109
Autor:
Hiroyuki Suzuki, Atsushi Uemoto, Hidekazu Susuki, Xin Man, Toshiaki Fujii, Masakatsu Hasuda, Tatsuya Asahata
Publikováno v:
Microscopy and Microanalysis. 20:354-355
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::08faa7787f5eb88755b855e288043ab4
https://doi.org/10.1017/s1431927614003493
https://doi.org/10.1017/s1431927614003493
Autor:
Koji Iwasaki, Masakatsu Hasuda, Tatsuya Asahata, Masanao Munekane, Yo Yamamoto, Hiromi Tashiro, Toshiaki Fujii, Masahiro Kiyohara, Takashi Kaito, Yutaka Ikku, Toshitada Takeuchi
Publikováno v:
MRS Proceedings. 983
Focused Ion Beam (FIB) system is equipment used to make a wide variety of micro and Nano structures. Structures can be created using various materials by irradiating focused gallium ion beam on to the surface of specimens and by sputtering, etching a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::668e6cb13cb50f3465a3a6c5829282f9
https://doi.org/10.1557/proc-983-0983-ll08-08
https://doi.org/10.1557/proc-983-0983-ll08-08
Autor:
Hidekazu Suzuki, Tatsuya Asahata, M Kiyohara, Y Yamamoto, Y Ikku, Toshiaki Fujii, H Takahashi, H Matsumura, K Iwasaki, M Sato
Publikováno v:
Microscopy and Microanalysis. 12:1290-1291
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4b744766dacc088dc74530461f1c572a
https://doi.org/10.1017/s1431927606062337
https://doi.org/10.1017/s1431927606062337
Publikováno v:
Japanese Journal of Applied Physics. 37:5080
A newly developed time-of-flight system equipped with an accelerating tube was applied to hydrogen adsorption on Cu–Pt alloy surfaces. The simultaneous measurements of the scattered neutrals, Ne0, and ions, Ne+, from adsorbates have shown that sele
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fab24f1d130e97be6a52d512c4b40bfa
https://doi.org/10.1143/jjap.37.5080
https://doi.org/10.1143/jjap.37.5080
Publikováno v:
Japanese Journal of Applied Physics. 36:7427
Basic problems in quantification by ion scattering spectroscopy (ISS), i.e., energy dependence of the detection efficiency of a micro channel plate (MCP) and neutralization probabilities, have been studied using a newly constructed time of flight (TO
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::50f785d5e63dea25b507f791a18fac0c
https://doi.org/10.1143/jjap.36.7427
https://doi.org/10.1143/jjap.36.7427