Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Tatsuhiro Gake"'
Autor:
Haruo Kobayashi, Nobukazu Takai, Masamichi Ishii, Osamu Kobayashi, Tatsuhiro Gake, Daiki Hirabayashi, Yuta Doi, Tatsuji Matsuura, Kiichi Niitsu, Satoshi Uemori, Takahiro Yamaguchi, Yuta Arakawa, Yuji Yano
Publikováno v:
Journal of Electronic Testing. 29:879-892
This paper describes the architecture and principles of operation of sigma-delta ( ΣΔ) time-to-digital converters (TDC) for high-speed I/O interface circuit test applications. In particular, we describe multi-bit ΣΔ TDC architectures; they offer
Autor:
Haruo Kobayashi, Takahiro Yamaguchi, Tatsuji Matsuura, Yuta Arakawa, Kiichi Niitsu, Masamichi Ishii, Daiki Hirabayashi, Tatsuhiro Gake, Osamu Kobayashi, Yuta Doi, Satoshi Uemori, Yuji Yano, Nobukazu Takai
Publikováno v:
APCCAS
This paper describes the architecture and principles of operation of sigma-delta (ΣΔ) time-to-digital converters (TDC) for high-speed I/O interface circuit test applications; they offer good accuracy with short test times. In particular, we describ
Autor:
Kiichi Niitsu, Osamu Kobayashi, Shinya Kishigami, Kunihito Rikino, Hiroyuki Miyashita, Tatsuhiro Gake, Kazuyuki Wakabayashi, Haruo Kobayashi, Yuji Yano, Takafumi Yamada, Keisuke Kato, Satoshi Uemori
Publikováno v:
2011 IEEE 17th International Mixed-Signals, Sensors and Systems Test Workshop.
This paper describes algorithms for generating low distortion single-tone and two-tone sine waves, for testing ADCs,using an arbitrary waveform generator (AWG). The AWGconsists of DSP and DAC, and the nonlinearity of the DACgenerates distortion compo