Zobrazeno 1 - 10
of 56
pro vyhledávání: '"Tasolamprou AC"'
Autor:
Perrakis G; Institute of Electronic Structure and Laser (IESL), Foundation for Research and Technology - Hellas (FORTH), 70013, Heraklion, Crete, Greece. gperrakis@iesl.forth.gr., Tasolamprou AC; Institute of Electronic Structure and Laser (IESL), Foundation for Research and Technology - Hellas (FORTH), 70013, Heraklion, Crete, Greece.; Department of Physics, National and Kapodistrian University of Athens, 15784, Athens, Greece., Kakavelakis G; Department of Electronic Engineering, Hellenic Mediterranean University, Romanou 3, Chalepa, 73100, Chania, Crete, Greece. kakavelakis@hmu.gr.; Laboratory of Photonics and Interfaces, Institute of Chemical Sciences and Engineering, Ecole Polytechnique Fédérale de Lausanne, 1015, Lausanne, Switzerland. kakavelakis@hmu.gr., Petridis K; Department of Electronic Engineering, Hellenic Mediterranean University, Romanou 3, Chalepa, 73100, Chania, Crete, Greece., Graetzel M; Laboratory of Photonics and Interfaces, Institute of Chemical Sciences and Engineering, Ecole Polytechnique Fédérale de Lausanne, 1015, Lausanne, Switzerland., Kenanakis G; Institute of Electronic Structure and Laser (IESL), Foundation for Research and Technology - Hellas (FORTH), 70013, Heraklion, Crete, Greece., Tzortzakis S; Institute of Electronic Structure and Laser (IESL), Foundation for Research and Technology - Hellas (FORTH), 70013, Heraklion, Crete, Greece.; Department of Materials Science and Technology, University of Crete, 70013, Heraklion, Crete, Greece.; Texas A&M University at Qatar, 23874, Doha, Qatar., Kafesaki M; Institute of Electronic Structure and Laser (IESL), Foundation for Research and Technology - Hellas (FORTH), 70013, Heraklion, Crete, Greece.; Department of Materials Science and Technology, University of Crete, 70013, Heraklion, Crete, Greece.
Publikováno v:
Scientific reports [Sci Rep] 2024 Jan 04; Vol. 14 (1), pp. 548. Date of Electronic Publication: 2024 Jan 04.
Autor:
Katsantonis I; Institute of Electronic Structure and Laser, Foundation for Research and Technology Hellas, 70013, Heraklion, Greece.; Department of Material Science and Technology, University of Crete, 70013, Heraklion, Greece., Tasolamprou AC; Institute of Electronic Structure and Laser, Foundation for Research and Technology Hellas, 70013, Heraklion, Greece.; Department of Physics, National and Kapodistrian University of Athens, 15772, Athens, Greece., Koschny T; Ames National Laboratory, Ames, IA, 50011, USA.; Department of Physics and Astronomy, Iowa State University, Ames, IA, 50011, USA., Economou EN; Institute of Electronic Structure and Laser, Foundation for Research and Technology Hellas, 70013, Heraklion, Greece.; Department of Physics, University of Crete, 70013, Heraklion, Greece., Kafesaki M; Institute of Electronic Structure and Laser, Foundation for Research and Technology Hellas, 70013, Heraklion, Greece.; Department of Material Science and Technology, University of Crete, 70013, Heraklion, Greece., Valagiannopoulos C; School of Electrical and Computer Engineering, National Technical University of Athens, 15772, Athens, Greece. valagiannopoulos@ece.ntua.gr.
Publikováno v:
Scientific reports [Sci Rep] 2023 Dec 11; Vol. 13 (1), pp. 21986. Date of Electronic Publication: 2023 Dec 11.
Autor:
Tsilipakos O; Theoretical and Physical Chemistry Institute, National Hellenic Research Foundation, GR-11635 Athens, Greece., Viskadourakis Z; Institute of Electronic Structure and Laser, Foundation for Research and Technology-Hellas, GR-70013 Heraklion, Crete, Greece., Tasolamprou AC; Institute of Electronic Structure and Laser, Foundation for Research and Technology-Hellas, GR-70013 Heraklion, Crete, Greece.; Section of Electronic Physics and Systems, Department of Physics, National and Kapodistrian University of Athens, GR-15784 Athens, Greece., Zografopoulos DC; Consiglio Nazionale delle Ricerche, Istituto per la Microelettronica e Microsistemi (CNR-IMM), 00133 Rome, Italy., Kafesaki M; Institute of Electronic Structure and Laser, Foundation for Research and Technology-Hellas, GR-70013 Heraklion, Crete, Greece.; Department of Materials Science Technology, University of Crete, GR-70013 Heraklion, Crete, Greece., Kenanakis G; Institute of Electronic Structure and Laser, Foundation for Research and Technology-Hellas, GR-70013 Heraklion, Crete, Greece., Economou EN; Institute of Electronic Structure and Laser, Foundation for Research and Technology-Hellas, GR-70013 Heraklion, Crete, Greece.; Department of Physics, University of Crete, GR-70013 Heraklion, Crete, Greece.
Publikováno v:
Micromachines [Micromachines (Basel)] 2023 Feb 17; Vol. 14 (2). Date of Electronic Publication: 2023 Feb 17.
Highly ordered laser imprinted plasmonic metasurfaces for polarization sensitive perfect absorption.
Autor:
Tasolamprou AC; Institute of Electronic Structure and Laser, Foundation for Research and Technology Hellas, N. Plastira 100, Crete, 71110, Heraklion, Greece. atasolam@iesl.foth.gr., Skoulas E; Institute of Electronic Structure and Laser, Foundation for Research and Technology Hellas, N. Plastira 100, Crete, 71110, Heraklion, Greece., Perrakis G; Institute of Electronic Structure and Laser, Foundation for Research and Technology Hellas, N. Plastira 100, Crete, 71110, Heraklion, Greece., Vlahou M; Institute of Electronic Structure and Laser, Foundation for Research and Technology Hellas, N. Plastira 100, Crete, 71110, Heraklion, Greece.; Department of Materials Science and Technology, University of Crete, 70013, Heraklion, Greece., Viskadourakis Z; Institute of Electronic Structure and Laser, Foundation for Research and Technology Hellas, N. Plastira 100, Crete, 71110, Heraklion, Greece., Economou EN; Institute of Electronic Structure and Laser, Foundation for Research and Technology Hellas, N. Plastira 100, Crete, 71110, Heraklion, Greece.; Department of Physics, University of Crete, 70013, Heraklion, Greece., Kafesaki M; Institute of Electronic Structure and Laser, Foundation for Research and Technology Hellas, N. Plastira 100, Crete, 71110, Heraklion, Greece.; Department of Materials Science and Technology, University of Crete, 70013, Heraklion, Greece., Kenanakis G; Institute of Electronic Structure and Laser, Foundation for Research and Technology Hellas, N. Plastira 100, Crete, 71110, Heraklion, Greece., Stratakis E; Institute of Electronic Structure and Laser, Foundation for Research and Technology Hellas, N. Plastira 100, Crete, 71110, Heraklion, Greece.; Department of Physics, University of Crete, 70013, Heraklion, Greece.
Publikováno v:
Scientific reports [Sci Rep] 2022 Nov 17; Vol. 12 (1), pp. 19769. Date of Electronic Publication: 2022 Nov 17.
Autor:
Perrakis G; Institute of Electronic Structure and Laser (IESL), Foundation for Research and Technology-Hellas (FORTH), 70013, Heraklion, Crete, Greece. gperrakis@iesl.forth.gr.; Department of Materials Science and Technology, University of Crete, Heraklion, Crete, Greece. gperrakis@iesl.forth.gr., Tasolamprou AC; Institute of Electronic Structure and Laser (IESL), Foundation for Research and Technology-Hellas (FORTH), 70013, Heraklion, Crete, Greece., Kenanakis G; Institute of Electronic Structure and Laser (IESL), Foundation for Research and Technology-Hellas (FORTH), 70013, Heraklion, Crete, Greece., Economou EN; Institute of Electronic Structure and Laser (IESL), Foundation for Research and Technology-Hellas (FORTH), 70013, Heraklion, Crete, Greece.; Department of Physics, University of Crete, 71003, Heraklion, Crete, Greece., Tzortzakis S; Institute of Electronic Structure and Laser (IESL), Foundation for Research and Technology-Hellas (FORTH), 70013, Heraklion, Crete, Greece.; Department of Materials Science and Technology, University of Crete, Heraklion, Crete, Greece.; Science Program, Texas A&M University at Qatar, P.O. Box 23874, Doha, Qatar., Kafesaki M; Institute of Electronic Structure and Laser (IESL), Foundation for Research and Technology-Hellas (FORTH), 70013, Heraklion, Crete, Greece.; Department of Materials Science and Technology, University of Crete, Heraklion, Crete, Greece.
Publikováno v:
Scientific reports [Sci Rep] 2021 Jun 02; Vol. 11 (1), pp. 11552. Date of Electronic Publication: 2021 Jun 02.
Autor:
Tasolamprou AC; Institute of Electronic Structure and Laser, Foundation for Research and Technology Hellas, 70013 Heraklion, Greece., Mentzaki D; Institute of Electronic Structure and Laser, Foundation for Research and Technology Hellas, 70013 Heraklion, Greece.; Department of Materials Science and Technology, University of Crete, 70013 Heraklion, Greece., Viskadourakis Z; Institute of Electronic Structure and Laser, Foundation for Research and Technology Hellas, 70013 Heraklion, Greece., Economou EN; Institute of Electronic Structure and Laser, Foundation for Research and Technology Hellas, 70013 Heraklion, Greece.; Physics Department, University of Crete, 70013 Heraklion, Greece., Kafesaki M; Institute of Electronic Structure and Laser, Foundation for Research and Technology Hellas, 70013 Heraklion, Greece.; Department of Materials Science and Technology, University of Crete, 70013 Heraklion, Greece., Kenanakis G; Institute of Electronic Structure and Laser, Foundation for Research and Technology Hellas, 70013 Heraklion, Greece.
Publikováno v:
Materials (Basel, Switzerland) [Materials (Basel)] 2020 Sep 02; Vol. 13 (17). Date of Electronic Publication: 2020 Sep 02.
Publikováno v:
Optics express [Opt Express] 2020 Jun 22; Vol. 28 (13), pp. 18548-18565.
Autor:
Tasolamprou AC; Institute of Electronic Structure and Laser, FORTH, 70013 Heraklion, Crete, Greece., Koulouklidis AD; Institute of Electronic Structure and Laser, FORTH, 70013 Heraklion, Crete, Greece., Daskalaki C; Institute of Electronic Structure and Laser, FORTH, 70013 Heraklion, Crete, Greece., Mavidis CP; Institute of Electronic Structure and Laser, FORTH, 70013 Heraklion, Crete, Greece.; Department of Materials Science and Technology, University of Crete, 70013 Heraklion, Crete, Greece., Kenanakis G; Institute of Electronic Structure and Laser, FORTH, 70013 Heraklion, Crete, Greece., Deligeorgis G; Institute of Electronic Structure and Laser, FORTH, 70013 Heraklion, Crete, Greece., Viskadourakis Z; Institute of Electronic Structure and Laser, FORTH, 70013 Heraklion, Crete, Greece., Kuzhir P; Institute for Nuclear Problems, Belarusian State University, Bobruiskaya 11, 220030 Minsk, Belarus.; Tomsk State University, 36 Lenin Avenue, Tomsk 634050, Russia., Tzortzakis S; Institute of Electronic Structure and Laser, FORTH, 70013 Heraklion, Crete, Greece.; Department of Materials Science and Technology, University of Crete, 70013 Heraklion, Crete, Greece.; Science Program, Texas A&M University at Qatar, P.O. Box 23874, Doha, Qatar., Kafesaki M; Institute of Electronic Structure and Laser, FORTH, 70013 Heraklion, Crete, Greece.; Department of Materials Science and Technology, University of Crete, 70013 Heraklion, Crete, Greece., Economou EN; Institute of Electronic Structure and Laser, FORTH, 70013 Heraklion, Crete, Greece.; Department of Physics, University of Crete, 70013 Heraklion, Crete, Greece., Soukoulis CM; Institute of Electronic Structure and Laser, FORTH, 70013 Heraklion, Crete, Greece.; Ames Laboratory and Department of Physics and Astronomy, Iowa State University, Ames, Iowa 50011, United States.
Publikováno v:
ACS photonics [ACS Photonics] 2019 Mar 20; Vol. 6 (3), pp. 720-727. Date of Electronic Publication: 2019 Feb 14.
Autor:
Tsilipakos O; Institute of Electronic Structure and Laser FORTH GR-71110 Heraklion Crete Greece., Tasolamprou AC; Institute of Electronic Structure and Laser FORTH GR-71110 Heraklion Crete Greece., Koschny T; Ames Laboratory-U.S. DOE and Department of Physics and Astronomy Iowa State University Ames IA 50011 USA., Kafesaki M; Institute of Electronic Structure and Laser FORTH GR-71110 Heraklion Crete Greece.; Department of Materials Science and Technology University of Crete GR-71003 Heraklion Crete Greece., Economou EN; Institute of Electronic Structure and Laser FORTH GR-71110 Heraklion Crete Greece.; Department of Physics University of Crete GR-71003 Heraklion Crete Greece., Soukoulis CM; Institute of Electronic Structure and Laser FORTH GR-71110 Heraklion Crete Greece.; Ames Laboratory-U.S. DOE and Department of Physics and Astronomy Iowa State University Ames IA 50011 USA.
Publikováno v:
Advanced optical materials [Adv Opt Mater] 2018 Nov 19; Vol. 6 (22), pp. 1800633. Date of Electronic Publication: 2018 Sep 17.
Autor:
Tasolamprou AC; Institute of Electronic Structure and Laser, FORTH, 71110, Heraklion, Crete, Greece., Koschny T; Ames Laboratory and Department of Physics and Astronomy, Iowa State University, Ames, Iowa 50011, United States., Kafesaki M; Institute of Electronic Structure and Laser, FORTH, 71110, Heraklion, Crete, Greece.; Department of Materials Science and Technology, University of Crete, 71003, Heraklion, Crete, Greece., Soukoulis CM; Institute of Electronic Structure and Laser, FORTH, 71110, Heraklion, Crete, Greece.; Ames Laboratory and Department of Physics and Astronomy, Iowa State University, Ames, Iowa 50011, United States.
Publikováno v:
ACS photonics [ACS Photonics] 2017 Nov 15; Vol. 4 (11), pp. 2782-2788. Date of Electronic Publication: 2017 Sep 28.