Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Tareq Muhammad Supon"'
Publikováno v:
IEEE Transactions on Electromagnetic Compatibility. 63:353-364
Security threats due to Hardware Trojans are growing in volume and variety. The miniature size of Trojans coupled with their diversity and their unpredictable effects made them difficult to detect. Researchers have proposed different techniques to ei
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d372757d935701a36547346692727597
https://doi.org/10.1109/temc.2020.3003728
https://doi.org/10.1109/temc.2020.3003728
Publikováno v:
AEU - International Journal of Electronics and Communications. 82:30-36
Bus-Invert ( BI ) coding schemes have been used in the circuit design to save power usage by minimizing the number of transitions between successive words. With an increased number of bits for bus width, many other coding schemes like Bus-Shift ( BS
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::972312b172bce5af5ec7d5d4b2df358e
https://doi.org/10.1016/j.aeue.2017.07.020
https://doi.org/10.1016/j.aeue.2017.07.020
Publikováno v:
Microelectronics Reliability. 124:114212
The advancement of Integrated Circuit (IC) technology has encouraged the IC industries to go fabless and outsource the fabrication to other companies, due to the cost associated with installing a new facility and design to production time limitations
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::71d74e18226c4b50b5e34e59f24edabb
https://doi.org/10.1016/j.microrel.2021.114212
https://doi.org/10.1016/j.microrel.2021.114212
Publikováno v:
DTIS
Hardware Trojan (HT) has become a serious threat to the semiconductor industry. Many solutions have been developed to detect Trojans and address hardware security concerns. However, due to the wide range of possible Trojans, specific solutions for ce
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::02b8ad544ddb95f935f95a15b157bef5
https://doi.org/10.1109/dtis.2019.8735085
https://doi.org/10.1109/dtis.2019.8735085
Publikováno v:
CCECE
The growing need for alternative sources to power sensors and portable devices has led to many power-scavenging solutions from ambient energy sources. As the technology scales down and the supply voltage drops, the complexity of power scavenging circ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::62c4c3d44f94c09ce3b535e129cf38a9
https://doi.org/10.1109/ccece.2016.7726622
https://doi.org/10.1109/ccece.2016.7726622
Publikováno v:
ITC
This study presents a new test method for Through Silicon Via (TSV) in 3D stacked ICs, in which a Delay-Locked Loop (DLL) is utilized to detect TSV defects. As compared to TSV test methods using free running ring oscillators, the proposed method pres
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::019326e2d2cb7d52636082ea3110fecf
https://doi.org/10.1109/test.2015.7342390
https://doi.org/10.1109/test.2015.7342390
Publikováno v:
ISCAS
In low-power VLSI design good amount of power can be saved by using coding scheme such as Bus-Invert (BI). Such a coding scheme looks at successive words on a data bus and applies transformation to minimize the number of transitions. In this paper we
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5b21634ef65cad10b2770c92fcfaa3c8
https://doi.org/10.1109/iscas.2015.7169303
https://doi.org/10.1109/iscas.2015.7169303
Publikováno v:
ICECS
The focus of this paper is to study the reliability issue of single-electron tunneling (SET) technology using multi-island structure for 1-bit full adder circuit. A new set of parameters are proposed in this paper showing better sensitivity towards t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c1528c0dbc48364bbb983b11ee3135e8
https://doi.org/10.1109/icecs.2011.6122238
https://doi.org/10.1109/icecs.2011.6122238
Publikováno v:
2011 IEEE 54th International Midwest Symposium on Circuits and Systems (MWSCAS).
A new readout and self-test circuit for MEMS devices is presented in this paper. A Phase Locked Loop (PLL) has been utilized to convert variations of MEM capacitance to time domain signals. The proposed scheme presents a robust performance against pr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::92952cb6731ee28f2ef63abce0a260c2
https://doi.org/10.1109/mwscas.2011.6026548
https://doi.org/10.1109/mwscas.2011.6026548
Publikováno v:
Journal of Circuits, Systems and Computers. 21:1240014
A new readout circuit for MEMS devices is presented in this paper. A Phase Locked Loop (PLL) has been utilized to convert variations of MEM capacitance to time domain signals. The proposed scheme presents a robust performance against process, power s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1716cdf480c5150e11b6f2b55054a6a5
https://doi.org/10.1142/s0218126612400142
https://doi.org/10.1142/s0218126612400142