Zobrazeno 1 - 10
of 33
pro vyhledávání: '"Tao Zhenlan"'
Publikováno v:
Nuclear Data Sheets. 83:145-284
The 1995 version of nuclear data sheets for A=196 has been revised. The experimental data for all known nuclei of A=196 (Os, Ir, Pt, Au, Hg, Tl, Pb, Bi, Po, At, Rn) have been reevaluated. Summary band structure drawings and level schemes from both ra
Autor:
Tao Zhenlan, Wang Gongqing
Publikováno v:
Nuclear Data Sheets. 76:1-126
The 1995 version of nuclear data sheets for A=196 has been revised. The experimental data for all known nuclei of A=196 (Os, Ir, Pt, Au, Hg, Tl, Pb, Bi, Po, At, Rn) have been reevaluated. Summary band structure drawings and level schemes from both ra
Autor:
Wang Zhen-Xia, Tao Zhenlan, Zhang Jiping, Zhang Hui-Ming, Zeng Yue-Wu, Wang Wenmin, Pan Jisheng
Publikováno v:
Vacuum. 46:247-250
The angular distribution of sputtered atoms and the surface topography of cadmium bombarded by 27 KeV Ar + ions were studied using Rutherford Backscattering Spectroscopy (RBS) and Scanning Electron Microscopy (SEM) analysis. It is shown that the vari
Publikováno v:
Journal of Materials Science Letters. 13:1132-1135
Publikováno v:
Acta Physica Sinica (Overseas Edition). 2:702-710
Angular distribution of sputtered atoms and the phenomenon of "element local richness relative to microtopographic feature" (ELR-MTF) of the sputtered target surface have been investigated on Cu-37 at% Ag alloys by means of Rutherford backscattering
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 74:380-384
Measurements of the angular distributions of atoms sputtered from Ni-50 wt.% Ti, Fe-30 wt.% W and Ag-50 wt.% Cu alloy targets by irradiation with 27 keV Ar + ions are reported. It has been found that Ti, Fe and Ag atoms are ejected preferentially at
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 67:514-517
The sputtering yields of silver have been measured as a function of the fluence of incident Ar+ ions (27 keV) using the collector technique and RBS analysis. The irradiated surface was examined by scanning electron microscopy (SEM). It is shown that
Publikováno v:
Journal of Materials Science Letters. 13:1585-1587
Publikováno v:
Journal of Materials Science Letters. 12:1324-1326
Autor:
Zhou Shuxin, Xie Yi-Fen, Tao Zhenlan, Zhang Jiping, Li Xinnian, Du Guangtian, Wang Zhenxia, Luo Wenyun, Wang Chuanshan, Pan Jisheng
Publikováno v:
Journal of Materials Science Letters. 14:33-34