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pro vyhledávání: '"Tanwir, Sarmad"'
Autor:
Tanwir, Sarmad
The test process for semiconductor devices involves generation and application of test patterns, failure logging and diagnosis. Traditionally, most of these activities cater for all possible faults without making any assumptions about the actual defe
Externí odkaz:
http://hdl.handle.net/10919/82736
Publikováno v:
2016 IEEE International High Level Design Validation & Test Workshop (HLDVT); 2016, p128-135, 8p
Publikováno v:
2015 IEEE International Test Conference (ITC); 2015, p1-10, 10p