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pro vyhledávání: '"Tanirah, Omar"'
Publikováno v:
In Microelectronic Engineering 15 June 2015 141:215-218
Autor:
Tanirah, Omar
Scanning near-field optical microscopy (SNOM) opens new frontiers in optical microscopy and spectroscopy measurements beyond the diffraction limit. The evolution of the nanotechnology field of devices with new functionality, integration of new materi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______707::b28ff4872682893fc1d65d5bd53778a8
https://hdl.handle.net/10900/111038
https://hdl.handle.net/10900/111038
