Zobrazeno 1 - 2
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pro vyhledávání: '"Tamar Cromwijk"'
Autor:
H. Tunç Çiftçi, Michael Verhage, Tamar Cromwijk, Laurent Pham Van, Bert Koopmans, Kees Flipse, Oleg Kurnosikov
Publikováno v:
Microsystems & Nanoengineering, Vol 8, Iss 1, Pp 1-11 (2022)
Abstract We present a new approach to tuning-fork-based atomic force microscopy for utilizing advanced “tip-on-chip” probes with high sensitivity and broad compatibility. Usually, such chip-like probes with a size reaching 2 × 2 mm2 drastically
Externí odkaz:
https://doaj.org/article/a51f1ba7bac8448bb9be014fe9356284
Autor:
Christos Messinis, Manashee Adhikary, Tamar Cromwijk, Theodorus T. M. van Schaijk, Stefan Witte, Johannes F. de Boer, Arie den Boef
Publikováno v:
Optics Continuum. 1:1202
A dark-field Digital Holographic Microscope with a single lens for imaging is a potential candidate for future overlay metrology on semiconductor wafers. Aberrations caused by this single lens are computationally corrected allowing high-resolution im
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fcb9fe8b22d65ecba712110d05272a01
https://doi.org/10.1364/optcon.460029
https://doi.org/10.1364/optcon.460029