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pro vyhledávání: '"Takumi Takinami"'
Autor:
Masakazu Okada, Tomohito Kouketsu, Masato Ito, Atsushi Kitayama, Masamitsu Tanaka, Takumi Takinami, Akira Fujimaki
Publikováno v:
IEICE Transactions on Electronics. :166-172
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fd7ff08ec8cb4d74c9a893e398d48d21
https://doi.org/10.1587/transele.e97.c.166
https://doi.org/10.1587/transele.e97.c.166
Publikováno v:
2013 IEEE 14th International Superconductive Electronics Conference (ISEC).
We report experimental results of bit-error-rate (BER) measurements in small-critical-current or lowered-biasvoltage rapid single-flux-quantum (RSFQ) circuits for power reduction. In such reduced-power RSFQ circuits, the BERs can be increased because
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::10d36e3161e6e44ffd8a4aff2f7b33bc
https://doi.org/10.1109/isec.2013.6604277
https://doi.org/10.1109/isec.2013.6604277