Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Takuji Arauchi"'
Autor:
Shotaro Takeuchi, Yoshiaki Nakamura, Akira Sakai, Toshiro Uchiyama, Narihito Okada, Keisuke Yamane, Yasuhiro Hashimoto, Kazuyuki Tadatomo, Takuji Arauchi
Publikováno v:
physica status solidi (b). 252:1142-1148
We have investigated the crystalline morphology such as lattice plane curvature and lattice plane tilting in (20–21) GaN films on (22–43) patterned sapphire substrates (PSS) by using X-ray rocking curve (XRC) measurements. The results of the symm
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::78c38c34983906c2a0740db09f14c567
https://doi.org/10.1002/pssb.201451562
https://doi.org/10.1002/pssb.201451562
Autor:
Shigeru Kimura, Akira Sakai, Takuji Arauchi, Yasuhiro Hashimoto, Yoshiaki Nakamura, Shotaro Takeuchi, Kazuyuki Tadatomo, Keisuke Yamane, Narihito Okada, Yasuhiko Imai
Publikováno v:
physica status solidi (b). 252:1149-1154
We have investigated the microscopic crystalline morphology such as lattice plane tilting and defects in semipolar (20–21) GaN films grown on (22–43) patterned sapphire substrates (PSS) by using position-dependent ω–2θ map measurement of X-ra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::828208a1f1d57f692b8c1eae1ceb8e97
https://doi.org/10.1002/pssb.201451564
https://doi.org/10.1002/pssb.201451564
Autor:
Takuji Arauchi, Kazumasa Hiramatsu, Shigeru Kimura, Yoshiaki Nakamura, Shotaro Takeuchi, Yasuhiko Imai, D.T. Khan, Hideto Miyake, Akira Sakai, Kunihiko Nakamura
Publikováno v:
Journal of Crystal Growth. 411:38-44
The microscopic crystalline structure (MCS) such as domain texturing, lattice tilting fluctuation and strain fluctuation in thick AlN films grown on trench-patterned AlN/α-Al2O3 templates was clarified by utilizing position-dependent X-ray microdiff
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::141dccca47a6e78a604d7a2f70f156e3
https://doi.org/10.1016/j.jcrysgro.2014.10.052
https://doi.org/10.1016/j.jcrysgro.2014.10.052
Autor:
Yoshiaki Nakamura, D.T. Khan, Hideto Miyake, Takuji Arauchi, Akira Sakai, Kunihiko Nakamura, Kazumasa Hiramatsu, Shotaro Takeuchi
Publikováno v:
physica status solidi (a). 211:731-735
We have investigated crystalline morphology such as wafer curvature, mosaicity, and lattice tilting of an AlN film grown on a triangular-striped AlN/α-Al2O3 template by X-ray rocking curve (XRC) and reciprocal space map (RSM) measurements. The resul
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c7d6e9d69ff900d4150e5662d4056776
https://doi.org/10.1002/pssa.201300461
https://doi.org/10.1002/pssa.201300461
Autor:
Takuji Arauchi, Yasuhiro Hashimoto, Shigeru Kimura, Narihito Okada, Shotaro Takeuchi, Akira Sakai, Toshiro Uchiyama, Yasuhiko Imai, Keisuke Yamane, Shohei Kamada, Kazuyuki Tadatomo
Publikováno v:
Japanese Journal of Applied Physics. 55:05FA07
We have investigated the position dependence of crystalline quality and defect distribution in a semipolar hydride vapor phase epitaxy (HVPE)-GaN film grown on a patterned sapphire substrate (PSS). Position-dependent X-ray microdiffraction (XRMD) mea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0f11d8eaad73191dbb61db135df3eb2d
https://doi.org/10.7567/jjap.55.05fa07
https://doi.org/10.7567/jjap.55.05fa07
Autor:
Dinh Thanh Khan, Shotaro Takeuchi, Yoshiaki Nakamura, Kunihiko Nakamura, Takuji Arauchi, Hideto Miyake, Kazumasa Hiramatsu, Yasuhiko Imai, Shigeru Kimura, Akira Sakai
Publikováno v:
Japanese Journal of Applied Physics; Feb2017, Vol. 56 Issue 2, p1-1, 1p
Autor:
Toshiro Uchiyama, Shotaro Takeuchi, Shohei Kamada, Takuji Arauchi, Yasuhiro Hashimoto, Keisuke Yamane, Narihito Okada, Yasuhiko Imai, Shigeru Kimura, Kazuyuki Tadatomo, Akira Sakai
Publikováno v:
Japanese Journal of Applied Physics; May2016, Vol. 55 Issue 5S, p1-1, 1p