Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Taketoshi Nakano"'
Publikováno v:
SID Symposium Digest of Technical Papers. 52:628-631
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6ee8783377f5e2a573a730d3bc13c7ad
https://doi.org/10.1002/sdtp.14761
https://doi.org/10.1002/sdtp.14761
Autor:
Akihiko Imaya, Taketoshi Nakano, Yoshinori Tanaka, Yoji Taniguchi, Akinori Kubota, Takeshi Hara, Hirohiko Nishiki, Atsushi Ban, Toshihiro Yamashita, Hidehito Kitakado
Publikováno v:
SID Symposium Digest of Technical Papers. 45:289-292
Digital Micro Shutter (DMS) Display based on MEMS design and process technologies provides wide color gamut, wide operating temperature range and low power consumption, compared with LCD and OLED which widely are used at the present time. Conventiona
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9a2c27992410786379fb1ccbe1ffd157
https://doi.org/10.1002/j.2168-0159.2014.tb00078.x
https://doi.org/10.1002/j.2168-0159.2014.tb00078.x
Autor:
Taketoshi Nakano, Imai Hajime, Shunpei Yamazaki, Takuya Matsuo Naofumi Kimura, Kenichi Okazaki, Yukio Mizuno, Taimi Oketani, Hiroyuki Miyake, Masahiro Takahashi, Yukinobu Nakata, Junichi Koezuka, Yoshiharu Kataoka, Tetsuji Ishitani Yoshiharu Hirakata, Tohru Daitoh, Masashi Tsubuku, Jun Koyama
Publikováno v:
SID Symposium Digest of Technical Papers. 44:771-774
Sharp succeeded the production of high performance LCD using IGZO for the first time in the world. With the extraordinary TFT characteristics, IGZO-TFT LCD can realize (1)lower power consumption and (2)higher touch panel performance than a-Si TFT LCD
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ca57a37bb892911054e1584c94779083
https://doi.org/10.1002/j.2168-0159.2013.tb06329.x
https://doi.org/10.1002/j.2168-0159.2013.tb06329.x
Publikováno v:
Japanese Journal of Applied Physics. 33:1708
A noncontact interferometric thermometry method based on phase-compensating interferometry is described. Direct frequency monitoring by the reference interferometer connected in parallel to the sensing interferometer provides temperature measurement
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6139ae85a1aeb9626145398dabdefbac
https://doi.org/10.1143/jjap.33.1708
https://doi.org/10.1143/jjap.33.1708