Zobrazeno 1 - 10
of 87
pro vyhledávání: '"Takeshi Nakazawa"'
Autor:
Michael Baldauf, Raphael Baumler, Aykut Ölçer, Takeshi Nakazawa, Knud Benedict, Sandro Fischer, Michèle Schaub
Publikováno v:
TransNav: International Journal on Marine Navigation and Safety of Sea Transportation, Vol 7, Iss 2, Pp 283-290 (2013)
The International Maritime Organization (IMO), through its Maritime Environmental Protection Committee (MEPC), has been carrying out substantive work on the reduction and limitation of greenhouse gas emissions from international shipping since 1997,
Externí odkaz:
https://doaj.org/article/0d845d50875e416588fffaa84e115eb2
This report highlights about an infectious dissecting aortic aneurysm caused by a rare pathogen, Streptococcus pseudopneumoniae, which had to be initially diagnosed large vessel vasculitis (LVV). Even with the availability of FDG-PET, it may be diffi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b9819fe6b0888db33944722155ce8245
https://doi.org/10.22541/au.167039469.93423575/v1
https://doi.org/10.22541/au.167039469.93423575/v1
Autor:
Yui Toyosawa, Utako Kimura, Mana Kurihara, Hiromitsu Noguchi, Tadahiko Matsumoto, Masataro Hiruma, Takeshi Nakazawa, Kenji Takamori, Yasushi Suga
Publikováno v:
Medical Mycology Journal. 63:21-23
Publikováno v:
Japanese Journal of Mycology; 2023, Vol. 64 Issue 2, p41-55, 15p
Publikováno v:
Journal for the Integrated Study of Dietary Habits. 31:29-38
Autor:
Takeshi Nakazawa, Deepak Kulkarni
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. 32:250-256
Abnormal defect pattern detection plays a key role in preventing yield loss excursion events for the semiconductor manufacturing. We present a method for detecting and segmenting abnormal wafer map defect patterns using deep convolutional encoder–d
Autor:
Yusuke Watanabe, Tadashi Ishihara, Shigeru Matsuda, Koichiro Sueyoshi, Yuki Nakamura, Shinichi Sasaki, Yuji Takeuchi, Ken Okamoto, Wataru Saito, Takaaki Kawasaki, Yasuaki Kumakawa, Kouhei Ishikawa, Tanaka Hiroshi, Yohei Hirano, Takeshi Nakazawa, Yutaka Kondo
Publikováno v:
Acute Medicine & Surgery
We report a case of COVID‐19‐induced extracorporeal membrane oxygenation treated by late i.v. steroid administration. Our case suggests the value of prospective clinical trials for the evaluation of steroid use in severe COVID‐19‐induced extr
Autor:
Deepak Kulkarni, Takeshi Nakazawa
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. 31:309-314
Wafer maps provide important information for engineers in identifying root causes of die failures during semiconductor manufacturing processes. We present a method for wafer map defect pattern classification and image retrieval using convolutional ne
Publikováno v:
Juntendo Medical Journal. 64:461-467
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. 29:257-262
We present a method for quantifying a risk for killer defects at layer level and estimating yield for substrate packages using information from design files. To calculate risk ranks and predicted yield, we define a risk distance that is a key paramet