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pro vyhledávání: '"Takeshi Kutsuwa"'
Autor:
Kiyohide Ichimi, Takeshi Kutsuwa, Tatsuya Sakamoto, Minoru Inada, Yutaka Taguchi, Kasatani Shinichi
Publikováno v:
Journal of Electronic Materials. 45:1321-1327
The durability of Ni electrodes, which are often used for Mg2Si thermoelectric chips, is poor at high working temperatures because of deposition of Mg at the Mg2Si/Ni interface and on the surface. Hence, a “Mg2Si/barrier material/Ni” structure wa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7c9a3808bdfa8e9dc025fc86fc0e82a9
https://doi.org/10.1007/s11664-015-4022-z
https://doi.org/10.1007/s11664-015-4022-z
