Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Takeo Sakakubo"'
Autor:
Yoshinori Iida, S.-I. Sano, T. Niiyama, Michio Sasaki, F. Masuoka, Takeo Sakakubo, I. Inoue, Naoshi Sakuma, Hidetoshi Nozaki, Yukio Endo, Shinji Ohsawa, Ryohei Miyagawa, Hironaga Honda, Yoshitaka Egawa, Sohei Manabe, Nobuo Nakamura, I. Yanase, Yoshiyuki Matsunaga, Tetsuya Yamaguchi, Yoshiki Ishizuka, N. Endoh, Hirofumi Yamashita, E. Ohba, Hisanori Ihara, H. Ichinose, A. Furukawa
Publikováno v:
Proceedings of IEEE International Solid-State Circuits Conference - ISSCC '94.
Shrinking pixel size in conventional CCD imagers degrades device performance. Unsatisfactory smear noise of -90 dB is attained in a 2/3-inch 2M pixel CCD imager. The STACK-CCD imager has a great advantage regarding this problem. A 100% aperture ratio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b9e949a941f2e1ac40805e7b42a82317
https://doi.org/10.1109/isscc.1994.344660
https://doi.org/10.1109/isscc.1994.344660
Publikováno v:
MRS Proceedings. 237
A hydrogenated amorphous silicon (a-Si:H) interface fabrication technology for the plasma CVD method, which can produce low interface defect density, is presented. The relation between the interface defect density and radio frequency (RF) power was i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::233ab19108b9d9a42dc7daecf20fcff9
https://doi.org/10.1557/proc-237-637
https://doi.org/10.1557/proc-237-637