Zobrazeno 1 - 10
of 19
pro vyhledávání: '"Takele Weldu GEBREWAHID"'
Autor:
Xiaocui Yan, Xiaoling Zhang, Mengyun Kou, Takele Weldu Gebrewahid, Jiaxin Xi, Zaifeng Li, Zhanjun Yao
Publikováno v:
Agronomy, Vol 14, Iss 2, p 264 (2024)
Wheat stripe rust, triggered by Puccinia striiformis f. sp. tritici, is among the most widespread and damaging wheat (Triticum L.) diseases. The development of cultivars harboring adult plant resistance (APR) to stripe rust is a better approach to co
Externí odkaz:
https://doaj.org/article/8686ea76d53d4dcd9898e33b92cc1a74
Publikováno v:
Journal of Integrative Agriculture, Vol 20, Iss 5, Pp 1302-1313 (2021)
Wheat leaf rust, triggered by Puccinia triticina Eriks (Pt), is among the most important diseases of wheat worldwide. Deploying resistant varieties against leaf rust is the most effective, environmentally-friendly and economic way to control the dise
Externí odkaz:
https://doaj.org/article/f27b2ad3ed0e4c0dae021b264d4c0e8a
Autor:
Takele Weldu Gebrewahid, Peipei Zhang, Yue Zhou, Xiaocui Yan, Xianchun Xia, Zhonghu He, Daqun Liu, Zaifeng Li
Publikováno v:
Crop Journal, Vol 8, Iss 4, Pp 655-665 (2020)
Stripe or yellow rust (YR) and leaf rust (LR) cause large losses in wheat production worldwide. Resistant cultivars curtail the levels of losses. The present study aimed to identify quantitative trait loci (QTL) for YR and LR resistance in 147 F2:6 r
Externí odkaz:
https://doaj.org/article/aa5d146592334ec0afc0b9934c0c00bd
Publikováno v:
Journal of Integrative Agriculture, Vol 18, Iss 5, Pp 1014-1023 (2019)
Wheat leaf rust, caused by Puccinia triticina (Pt), is an important foliar disease that has an important influence on wheat yield. The most economic, safe and effective way to control the disease is growing resistant cultivars. In the present study,
Externí odkaz:
https://doaj.org/article/df365760638644178089845a7ebd16fc
Publikováno v:
Czech Journal of Genetics & Plant Breeding; 2023, Vol. 59 Issue 4, p219-234, 16p
Publikováno v:
Journal of Integrative Agriculture, Vol 20, Iss 5, Pp 1302-1313 (2021)
Wheat leaf rust, triggered by Puccinia triticina Eriks (Pt), is among the most important diseases of wheat worldwide. Deploying resistant varieties against leaf rust is the most effective, environmentally-friendly and economic way to control the dise
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7925142825e9aaf3d60fab78ccd2adac
http://www.sciencedirect.com/science/article/pii/S2095311920633718
http://www.sciencedirect.com/science/article/pii/S2095311920633718
Autor:
Zhonghu He, Xianchun Xia, Yue Zhou, Daqun Liu, Xiaocui Yan, Zaifeng Li, Ennian Yang, Peipei Zhang, Takele-Weldu Gebrewahid
Publikováno v:
Theoretical and Applied Genetics. 134:1233-1251
A genome-wide association analysis identified diverse loci for seedling and adult plant resistance to leaf rust and stripe rust. KASP markers were developed and validated for marker-assisted selection. Wheat leaf rust and stripe rust cause significan
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cf5b527b97153bed230a577079c126fb
https://doi.org/10.1007/s00122-021-03769-3
https://doi.org/10.1007/s00122-021-03769-3
Publikováno v:
Plant Disease. 104:2354-2361
Wheat leaf rust, caused by Puccinia triticina (Pt), is a widespread disease of bread wheat worldwide. In the present study, 50 wheat cultivars from Ethiopia and 34 differential lines, mostly near-isogenic lines (NILs) in the background of Thatcher wi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::75798ff14fbf994e5605d05c9c28068d
https://doi.org/10.1094/pdis-12-19-2606-re
https://doi.org/10.1094/pdis-12-19-2606-re
Autor:
Xianchun Xia, Yue Zhou, Zaifeng Li, Takele Weldu Gebrewahid, Xiaocui Yan, Daqun Liu, Peipei Zhang, Zhonghu He
Publikováno v:
Crop Journal, Vol 8, Iss 4, Pp 655-665 (2020)
Stripe or yellow rust (YR) and leaf rust (LR) cause large losses in wheat production worldwide. Resistant cultivars curtail the levels of losses. The present study aimed to identify quantitative trait loci (QTL) for YR and LR resistance in 147 F2:6 r
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::38fc5044bf9ceb6614b2bfa62651f0ad
http://www.sciencedirect.com/science/article/pii/S2214514120300015
http://www.sciencedirect.com/science/article/pii/S2214514120300015
Autor:
Zhonghu He, Xianchun Xia, Pu Gao, Zaifeng Li, Daqun Liu, Yue Zhou, Peipei Zhang, Takele Weldu Gebrewahid, Yong Ren
Publikováno v:
Phytopathology®. 110:1074-1081
Stripe rust and leaf rust cause wheat yield losses of up to 70% worldwide. The employment of resistant cultivars is the major method to reduce losses from these diseases. The objective of this study was to detect quantitative trait loci (QTL) for str
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::51ba6cd4f8d274e05e13bc4458632ac0
https://doi.org/10.1094/phyto-08-19-0316-r
https://doi.org/10.1094/phyto-08-19-0316-r