Zobrazeno 1 - 10
of 35
pro vyhledávání: '"Takayuki Nakatani"'
Publikováno v:
Nature Communications, Vol 10, Iss 1, Pp 1-10 (2019)
The authors here perform experiments to investigate the dihedral angle of olivine-H2O and olivine-H2O-NaCl systems. The observed effect of NaCl to decrease dihedral angles allows fluids to percolate through forearc mantle wedge and to accumulate in t
Externí odkaz:
https://doaj.org/article/b22cc7d2a9ed4b008e02540cbfc80d36
Autor:
Shuhei Yamamoto, Yuto Sasaki, Yujie Zhao, Anna Kuwana, Kentaroh Katoh, Zheming Zhang, Jianglin Wei, Tri Minh Tran, Shogo Katayama, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Takayuki Nakatani, Kazumi Hatayama, Haruo Kobayashi
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 22:142-153
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::070ec17f5c5114eba56aac67a35d4161
https://doi.org/10.1109/tdmr.2022.3159741
https://doi.org/10.1109/tdmr.2022.3159741
Autor:
Yujie Zhao, Kentaroh Katoh, Anna Kuwana, Shogo Katayama, Jianglin Wei, Haruo Kobayashi, Takayuki Nakatani, Kazumi Hatayama, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa
Publikováno v:
Journal of Electronic Testing. 38:21-38
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d34c9aaa7dbc991743fec0063d1d1b82
https://doi.org/10.1007/s10836-022-05988-y
https://doi.org/10.1007/s10836-022-05988-y
Autor:
Keno Sato, Takayuki Nakatani, Shogo Katayama, Daisuke Iimori, Gaku Ogihara, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Yujie Zhao, Kentaroh Katoh, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi
Publikováno v:
2022 IEEE 31st Asian Test Symposium (ATS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a3e90ca069c0d8fc6c995c9789e63d02
https://doi.org/10.1109/ats56056.2022.00019
https://doi.org/10.1109/ats56056.2022.00019
Autor:
Yujie Zhao, Kentaroh Katoh, Anna Kuwana, Shogo Katayama, Daisuke Iimori, Yuki Ozawa, Takayuki Nakatani, Kazumi Hatayama, Haruo Kobayashi, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa
Publikováno v:
2022 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::195d45211c1c4487fd8525f675829059
https://doi.org/10.1109/icce-asia57006.2022.9954832
https://doi.org/10.1109/icce-asia57006.2022.9954832
Publikováno v:
Journal of Geophysical Research: Solid Earth. 127
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::54a89ca4e6a4fb464a16fdbb3919fd61
https://doi.org/10.1029/2021jb023665
https://doi.org/10.1029/2021jb023665
Autor:
Chris Mangelsdorf, Manasa Madhvaraj, Salvador Mir, Manuel Barragan, Daisuke Iimori, Takayuki Nakatani, Shogo Katayama, Gaku Ogihara, Yujie Zhao, Jianglin Wei, Anna Kuwana, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa
Publikováno v:
2022 IEEE 40th VLSI Test Symposium (VTS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::12572171d842d9df95d3c606586d6a87
https://doi.org/10.1109/vts52500.2021.9794191
https://doi.org/10.1109/vts52500.2021.9794191
Autor:
Yuto Sasaki, Anna Kuwana, Yuki Ozawa, Yuan Yang Du, Yujie Zhao, Toshiyuki Okamoto, Kazumi Hatayama, Keno Sato, Tamotsu Ichikawa, Haruo Kobayashi, Takashi Ishida, Takayuki Nakatani
Publikováno v:
Advanced Engineering Forum. 38:83-92
This paper describes two algorithms for generating test signals to efficiently test the linearity of ADCs. Linearity is an important testing item for ADCs, and it takes a long time (hence is costly) to test especially low-sampling-rate, high-resoluti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::41e319b958d73629fd17e8819e080622
https://doi.org/10.4028/www.scientific.net/aef.38.83
https://doi.org/10.4028/www.scientific.net/aef.38.83
Autor:
Shogo Katayama, Takayuki Nakatani, Daisuke Iimori, Misaki Takagi, Yujie Zhao, Anna Kuwana, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi
Publikováno v:
IEICE Electronics Express. 20:20220470-20220470
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0cf896a2aea242cd667dc14a3da56ca5
https://doi.org/10.1587/elex.19.20220470
https://doi.org/10.1587/elex.19.20220470