Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Takashi Kurafuji"'
Autor:
Takashi Kurafuji, Koichi Takeda, Tomoya Ogawa, Yasuhiko Taito, Masaya Nakano, Takashi Kono, Takashi Ito, Hiroyuki Kondo, Akihiko Kanda, Kazuo Yoshihara
Publikováno v:
IEEE Solid-State Circuits Letters. 2:273-276
This letter presents an embedded flash (eFlash) system based on 28-nm split-gate MONOS (SG-MONOS) with high- ${k}$ metal gate CMOS process technology for automotive applications. It contains the world’s largest 24-MB memory capacity (4-MB code flas
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8f31c565738295b5d1a288719142e4a0
https://doi.org/10.1109/lssc.2019.2948813
https://doi.org/10.1109/lssc.2019.2948813
Autor:
Masaya Nakano, Yoshinobu Kaneda, Koichi Takeda, Takahiro Shimoi, Yasunobu Aoki, Satoru Nakanishi, Yosuke Tashiro, Yasuhiko Taito, Ken Matsubara, Munekatsu Nakagawa, Tomoya Ogawa, Takashi Kurafuji, Hidenori Mitani, Takashi Ito, Takashi Kono
Publikováno v:
2021 IEEE Asian Solid-State Circuits Conference (A-SSCC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8387108e340cae168a1c50eab79bde98
https://doi.org/10.1109/a-sscc53895.2021.9634782
https://doi.org/10.1109/a-sscc53895.2021.9634782
Autor:
Akihiko Kanda, Kazuo Yoshihara, Hiroyuki Kondo, Tomoya Ogawa, Masaya Nakano, Koichi Takeda, Takashi Kurafuji, Takashi Ito, Takashi Kono, Yasuhiko Taito
Publikováno v:
VLSI Circuits
This paper presents an embedded Flash system based on 28nm SG-MONOS technologies for automotive. It contains the world’s largest 24MB code Flash memories and achieves 240MHz random read access at Tj of 170°C and -40°C. The peak current for progra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::22a49bb36edf6e3e8b75b6fafae0e97a
https://doi.org/10.23919/vlsic.2019.8778107
https://doi.org/10.23919/vlsic.2019.8778107