Zobrazeno 1 - 10
of 15
pro vyhledávání: '"Takashi Dobashi"'
Publikováno v:
Japanese Journal of Applied Physics.
Machine learning was applied to optimize etching profile for line-and-space pattern sample in plasma etching. To investigate effect of difference of initial-learning dataset on optimization of etching profile, high-, medium-, and low-quality datasets
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::00376607f684cd297b0a6041fdc96af6
https://doi.org/10.35848/1347-4065/accd7b
https://doi.org/10.35848/1347-4065/accd7b
Publikováno v:
Microscopy and Microanalysis. 26:1162-1163
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a2869fdd0b842de28fe24d9a646f9b22
https://doi.org/10.1017/s143192762001716x
https://doi.org/10.1017/s143192762001716x
Autor:
Takashi, Dobashi
Publikováno v:
中央学院大学人間・自然論叢 = The Bulletin of Chuo-Gakuin University ―Man & Nature―. 40:141-154
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=jairo_______::52fb490f6f645a8ad2b755e98b3f5cb0
http://id.nii.ac.jp/1471/00001510/
http://id.nii.ac.jp/1471/00001510/
Autor:
Takashi, Dobashi
Publikováno v:
中央学院大学人間・自然論叢 = The Bulletin of Chuo-Gakuin University ―Man & Nature―. 39:113-122
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=jairo_______::85a9f70ec9efd0d65fd878db52e94958
http://id.nii.ac.jp/1471/00001500/
http://id.nii.ac.jp/1471/00001500/
Publikováno v:
Ultramicroscopy. 110:130-133
A new electron diffraction microscope based on a conventional scanning electron microscope (SEM), for obtaining atomic-level resolution images without causing serious damage to the specimen, has been developed. This microscope in the relatively low-v
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::456a16e99ebfd65f937d5d198df7e6d8
https://doi.org/10.1016/j.ultramic.2009.10.010
https://doi.org/10.1016/j.ultramic.2009.10.010
Autor:
Ryo Kitaura, Takashi Dobashi, Hisanori Shinohara, Osamu Kamimura, Kazutoshi Gohara, Yosuke Maehara
Publikováno v:
Microscopy and Microanalysis. 21:35-36
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::05e9f45e4c68e272c6ed09a73cc2e91a
https://doi.org/10.1017/s1431927615000975
https://doi.org/10.1017/s1431927615000975
Publikováno v:
Physical Review B. 81
This Rapid Communication presents a method of beam-divergence deconvolution for diffractive imaging. First, the detected diffraction intensity is formulated as a convolution between the diffraction intensity of parallel incident beams and the diverge
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5b169d0950f797b689e7df2f7ef66df3
https://doi.org/10.1103/physrevb.81.081404
https://doi.org/10.1103/physrevb.81.081404
Publikováno v:
MRS Proceedings. 1026
The spatial distribution of flux pinning centers in YBa2Cu3O7 (YBCO) coated conductors significantly affects the conductive properties. Nanoparticles acting as pinning centers can be intentionally introduced into the structure by chemical doping. In
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9b02d857143ce8e274f6cff6ec1ef21e
https://doi.org/10.1557/proc-1026-c07-06
https://doi.org/10.1557/proc-1026-c07-06
Publikováno v:
Microscopy and Microanalysis. 15:746-747
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::72a61828339b35a4b8093f8b9d0cad87
https://doi.org/10.1017/s1431927609093842
https://doi.org/10.1017/s1431927609093842
Publikováno v:
Acta Crystallographica Section A Foundations of Crystallography. 64:C65-C66
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::339536d8f0a12d91410bea07f329fd66
https://doi.org/10.1107/s0108767308097900
https://doi.org/10.1107/s0108767308097900