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pro vyhledávání: '"Takanori Hiramoto"'
Publikováno v:
Journal of the Japan Institute of Metals. 72:745-750
Using the basic solution made of Bi(NO3)3•5H2O(4.0×10-3, 4.5×10-3, 5.0×10-3, 6.0×10-3, 7.0×10-3 kmol•m-3), TeO2: (3.0×10-3 kmol•m-3) and nitrilotriacetic acid (NTA: 0.1 kmol•m-3) at pH 9.5, electrochemical deposition of stoichiometric,
Autor:
Norihiro Harada, Osamu Yamasaki, Naoki Idani, Toshiyuki Shibuya, Takanori Hiramoto, Daisuke Fukuda, Izumi Nitta, Yuji Kanazawa, Masaru Ito
Publikováno v:
ISQED
Chemical Mechanical Polishing (CMP)-aware design has become important for reliability and yield. Recent work on predictive models for wafer surface planarity of Cu CMP has proven that the variation of wafer surface planarity is impacted by the metal