Early Detection of Bar-Shaped 1SSF before Expansion by PL Imaging

Autor: Morita, Takuya, Matsushita, Yohsuke, Igarashi, Yasuyuki, Takano, Kazumi

Publikováno v: Diffusion and Defect Data Part A: Defect and Diffusion Forum; August 2024, Vol. 434 Issue: 1 p33-38, 6p

Accuracy of EVC Method for the PiN Diode Pattern on SiC Epi-Wafer

Autor: Takano, Kazumi, Morita, Takuya, Matsushita, Yohsuke, Igarashi, Yasuyuki

Publikováno v: Diffusion and Defect Data Part A: Defect and Diffusion Forum; August 2024, Vol. 434 Issue: 1 p15-21, 7p

S-EVC Method for Sorting Wafers with Defects that Extend to Bar Shaped SSFs

Autor: Takano, Kazumi, Matsushita, Yohsuke, Igarashi, Yasuyuki

Publikováno v: Diffusion and Defect Data Part A: Defect and Diffusion Forum; May 2023, Vol. 425 Issue: 1 p69-74, 6p

Effect of reading a massage book

Autor: Takano Kazumi, Tanii Junichi

Publikováno v: The Proceedings of the Annual Convention of the Japanese Psychological Association. 75:2PM131-2PM131

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::86af92d1a4a259c629a4ba5e55ac3ff9
https://doi.org/10.4992/pacjpa.75.0_2pm131