Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Takanari Fujiwara"'
Autor:
M. Fujii, M. Takeuchi, Takanari Fujiwara, Naofumi Murata, Miho Yokota, Hiromitsu Sugimoto, Masakazu Okada, H. Makino, Motoshige Igarashi, Naohiko Takeshita, Takeshi Kawamura, Nobuhiro Tsuda, Kyoko Asahina, Koji Nii, Shigehisa Yamamoto, T. Tsutsui, T. Yoshizawa, Shigeki Ohbayashi, Hirofumi Shinohara, Kazuo Tomita, Tomohiro Tanaka
Publikováno v:
IEICE Transactions on Electronics. :1338-1347
We propose a new large-scale logic test element group (TEG), called a flip-flop RAM (FF-RAM), to improve the total process quality before and during initial mass production. It is designed to be as convenient as an SRAM for measurement and to imitate
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::841dc540e081bde3bfdced3a4f5ecc11
https://doi.org/10.1093/ietele/e91-c.8.1338
https://doi.org/10.1093/ietele/e91-c.8.1338
Publikováno v:
Asian Cardiovascular & Thoracic Annals; Mar2020, Vol. 28 Issue 3, p189-189, 1p