Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Takahiro Kodaira"'
Autor:
Kana Maeda, Yasunari Houjyou, Takuma Komatsu, Hiroki Hori, Takahiro Kodaira, Atsushi Ishikawa
Publikováno v:
Molecular Plant-Microbe Interactions, Vol 22, Iss 11, Pp 1331-1340 (2009)
Rice blast, caused by Magnaporthe oryzae, is a devastating disease of rice (Oryza sativa). The mechanisms involved in resistance of rice to blast have been studied extensively and the rice–M. oryzae pathosystem has become a model for plant–microb
Externí odkaz:
https://doaj.org/article/6f6f61b502914145b54114eda4eb0333
Autor:
Takuma Komatsu, Atsushi Ishikawa, Hiroki Hori, Takahiro Kodaira, Yasunari Houjyou, Kana Maeda
Publikováno v:
Molecular Plant-Microbe Interactions®. 22:1331-1340
Rice blast, caused by Magnaporthe oryzae, is a devastating disease of rice (Oryza sativa). The mechanisms involved in resistance of rice to blast have been studied extensively and the rice–M. oryzae pathosystem has become a model for plant–microb
Publikováno v:
Bioscience, biotechnology, and biochemistry. 77(6)
The rate of entry of Magnaporthe oryzae into Arabidopsis pen2 sobir1 plants was significantly higher than that into pen2 plants. The length of the infection hyphae in pen2 sobir1 plants was significantly longer than that in pen2 plants. These results
Autor:
Takuma Komatsu, Takahiro Kodaira, Atsushi Ishikawa, Hiroki Hori, Yasunari Houjyou, Kana Maeda
Publikováno v:
Plant signalingbehavior. 5(6)
Rice blast, caused by Magnaporthe oryzae, is a devastating disease of rice (Oryza sativa). The mechanisms involved in resistance of rice to blast have been studied extensively and the rice--M. oryzae pathosystem has become a model for plant--microbe
Autor:
Eiichi Ono, Etsuo Katsuyama, Takahiro Kodaira, Hideki Sakai, Motoshi Ooki, Katsuhiko Fukui, Yuji Muragishi
Publikováno v:
SAE Technical Paper Series.
Autor:
Eiichi Ono, Katsuhiko Fukui, Yasushi Yamamoto, Yuji Muragishi, Takahiro Kodaira, Hideki Sakai
Publikováno v:
SAE Technical Paper Series.
Autor:
Katsuhiko Fukui, Eiichi Ono, Yasushi Yamamoto, Yuji Muragishi, Takahiro Kodaira, Hideki Sakai
Publikováno v:
SAE Technical Paper Series.