Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Takahiro Akiyoshi"'
Publikováno v:
Applied Mechanics and Materials. 870:237-242
A novel Micro Electro Mechanical System (MEMS) measurement device for straightness measurement with a three point method has been proposed. This device integrates three cantilever displacement sensors with a narrow pitch on a silicon chip. The author
Publikováno v:
Electrochimica Acta. 100:236-241
The electrodeposition of silicon from silicon tetrachloride in the hydrophobic room temperature ionic liquid trimethyl-n-hexyl ammonium bis-(trifluoromethylsulfonyl) imide was investigated by cyclic voltammetry and chronoamperometry. In situ electroc
Publikováno v:
ECS Transactions. 50:117-126
Electrodeposition of Si has attracted attention recently because of the relatively simple electrochemical process compared with conventional methods of Si deposition such as CVD, sputtering and e-beam evaporation. Si electrodeposition has the possibi
Autor:
Yumiko H. Nishimura, Takanari Ouchi, Takayuki Homma, Takahiro Akiyoshi, Tetsuo Nishida, Y. Iishibashi, Jason Komadina, Y. Nakano, Yasuhiro Fukunaka
Publikováno v:
ECS Transactions. 41:9-15
Electrodeposition of Si has gained interest recently due to the relative simplicity of electrochemical processing over conventional methods of Si deposition. In this report, we present our progress in the development of Si nanowire arrays electrodepo
Autor:
Jason Komadina, Takahiro Akiyoshi, Yoko Ishibashi, Yasuhiro Fukunaka, Piero Pianetta, Takayuki Homma
Publikováno v:
ECS Meeting Abstracts. :1029-1029
not Available.
Autor:
Jason Komadina, Takahiro Akiyoshi, Yoko Ishibashi, Xiaohui Wang, Yasuhiro Fukunaka, Piero Pianetta, T. Homma
Publikováno v:
ECS Meeting Abstracts. :3352-3352
not Available.
Autor:
Jason Komadina, Takahiro Akiyoshi, Yoko Ishibashi, Yasuhiro Fukunaka, Piero Pianetta, Takayuki Homma
Publikováno v:
ECS Meeting Abstracts. :1037-1037
not Available.
Autor:
Liang Chia Chen, Duc-Hieu Duong
ISMTII 2015Selected, peer reviewed papers from the12th International Symposium on Measurement Technology and Intelligent Instruments, September 22-25, 2015, Taipei, Taiwan