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Autor:
Natsuki Iijima, Masayuki Takeda, Katsumi Nakatsuhara, Mao Hijikata, Takeshi Nishizawa, Satoru Noge, Naoya Katsumata, Yoshiki Hayama, Taka Yamaguchi
Publikováno v:
2019 24th Microoptics Conference (MOC).
Ce:YIG thin films deposited on the silicon substrates were fabricated and their crystalline quality was investigated. In addition, a silicon waveguide Mach-Zehnder interferometer having a crystallized Ce:YIG cladding was fabricated. The transmitted w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::586f29733cb00274e5f8c464b65f7e9d
https://doi.org/10.23919/moc46630.2019.8982809
https://doi.org/10.23919/moc46630.2019.8982809
