Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Taillon JA"'
NexusLIMS: A Laboratory Information Management System for Shared-Use Electron Microscopy Facilities.
Autor:
Taillon JA; Office of Data and Informatics, Material Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO80305, USA., Bina TF; Materials Science and Engineering Division, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD20899, USA.; Office of Data and Informatics, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD20899, USA., Plante RL; Office of Data and Informatics, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD20899, USA., Newrock MW; Office of Data and Informatics, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD20899, USA., Greene GR; Office of Data and Informatics, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD20899, USA., Lau JW; Materials Science and Engineering Division, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD20899, USA.
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2021 Apr 28, pp. 1-17. Date of Electronic Publication: 2021 Apr 28.
Autor:
Romano C; Museum Conservation Institute, Smithsonian Institution, Suitland, MD, USA., Lam T; Museum Conservation Institute, Smithsonian Institution, Suitland, MD, USA., Newsome GA; Museum Conservation Institute, Smithsonian Institution, Suitland, MD, USA., Taillon JA; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA., Little N; Museum Conservation Institute, Smithsonian Institution, Suitland, MD, USA., Tsang JS; Museum Conservation Institute, Smithsonian Institution, Suitland, MD, USA.
Publikováno v:
Studies in conservation = Etudes de conservation [Stud Conserv] 2020; Vol. 65.
Autor:
Taillon JA; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg MD USA., Devers RF; Department of Electrical and Computer Engineering, University of Maryland, College Park, MD USA., Plante RL; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg MD USA., Newrock MW; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg MD USA., Lau JW; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg MD USA., Greene G; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg MD USA.
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2019 Aug; Vol. 25 (Suppl 2), pp. 140-141.
Autor:
Taillon JA; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA.
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2018 Aug; Vol. 24 (Suppl 1), pp. 752-753.
Autor:
Taillon JA; Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA.
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2018 Aug; Vol. 24 (Suppl 1), pp. 486-487.
Autor:
Taillon JA; University of Maryland, Materials Science and Engineering, College Park, MD 20742, United States. Electronic address: joshua.taillon@nist.gov., Pellegrinelli C; University of Maryland Energy Research Center, Materials Science and Engineering, College Park, MD 20742, United States., Huang YL; University of Maryland Energy Research Center, Materials Science and Engineering, College Park, MD 20742, United States., Wachsman ED; University of Maryland Energy Research Center, Materials Science and Engineering, College Park, MD 20742, United States., Salamanca-Riba LG; University of Maryland, Materials Science and Engineering, College Park, MD 20742, United States. Electronic address: riba@umd.edu.
Publikováno v:
Ultramicroscopy [Ultramicroscopy] 2018 Jan; Vol. 184 (Pt A), pp. 24-38. Date of Electronic Publication: 2017 Aug 09.
Autor:
Taillon JA; 1Department of Materials Science and Engineering,University of Maryland,College Park,MD 20742,USA., Ray V; 2PBS&T,MEO Engineering Company,290 Broadway,Suite 298,Methuen,MA 01844,USA., Salamanca-Riba LG; 1Department of Materials Science and Engineering,University of Maryland,College Park,MD 20742,USA.
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2017 Aug; Vol. 23 (4), pp. 872-877. Date of Electronic Publication: 2017 May 09.