Výsledky vyhledávání - "Taiarol, F."

Conference

High resolution X-ray diffraction and transmission electron microscopy investigation on As and P incorporation in MOCVD and CBE grown In(GaAs)P/InP 'false' multi quantum wells.

Autor: Ferrari, C., Lazzarini, L., Salviati, G., Gastaldi, L., Taiarol, F., Schiavini, G., Rigo, C.

Publikováno v: 1993 (5th) International Conference on Indium Phosphide & Related Materials; 1993, p199-202, 4p

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Periodical

Fluorination Role on Oxide Impurities in Fluorozirconate Glasses

Autor: Braglia, Marco, Ferraris, Monica, Grego, Giorgio, Parisi, Giuseppe, Salasco, L., Taiarol, F.

Publikováno v: Materials Science Forum; January 1991, Vol. 67 Issue: 1 p13-18, 6p

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