Hard X-ray free-electron laser with femtosecond-scale timing jitter

Autor: Woul-Woo Lee, Soung Park, In Soo Ko, Kwang-Woo Kim, Sang-Hee Kim, Su-Nam Kim, Seung Nam Kim, Sang Han Park, Hoon Heo, Seung-Hwan Kim, Soung Youl Baek, Nam-Suk Jung, Sang Soo Kim, Sung-Ju Park, Sojeong Lee, Sunmin Hwang, Jae Hyuk Lee, Young-Chan Kim, Byoung Ryul Park, Inhyuk Nam, Bongsoo Kim, Chang-Ki Min, Tae-Yeong Koo, Hyo-Jin Choi, Jangwoo Kim, Geonyeong Mun, Seong Hun Jeong, Chae-Yong Lim, Heung-Sik Kang, Young Gyu Jung, Donghyun Na, KwangHoon Kim, Young Jin Suh, Jaeku Park, Dong Eon Kim, Hyung Suh, Seonghan Kim, Mong-Soo Lee, Haeryong Yang, Sangbong Lee, Hee-Seock Lee, Tai-Hee Kang, Seonghoon Jung, Dong Cheol Shin, Intae Eom, Juho Hong, Kyung Sook Kim, Ki-Hyeon Park, Min Ho Kim, Hong Gi Lee, Hocheol Shin, Myong-jin Kim, Jung-Moo Yang, Sang-Youn Park, Yongsam Kim, Bong-Ho Lee, Gyujin Kim, Chung-Jong Yu, Chae-Soon Lee, Jang-Hui Han, Jinyul Hu, Bonggi Oh, Chi-Won Sung, Jaehyun Park, Yong Woon Parc, Heung-Soo Lee, Changbum Kim, Soonam Kwon, Ik-Su Mok, Yong Jung Park, HyoJung Hyun, Ji Hwa Kim, Ki Hyun Nam, Seungyu Rah, Jaehun Park

Publikováno v: Nature Photonics. 11:708-713

The hard X-ray free-electron laser at the Pohang Accelerator Laboratory (PAL-XFEL) in the Republic of Korea achieved saturation of a 0.144 nm free-electron laser beam on 27 November 2016, making it the third hard X-ray free-electron laser in the worl

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::80521e309e34d6075abb7e367b87ee96
https://doi.org/10.1038/s41566-017-0029-8

Selective catalytic burning of graphene by SiOxlayer depletion

Autor: Kyoung-Jae Lee, Tai-Hee Kang, Hyun-Joon Shin, Kyuwook Ihm, Jaeyoon Baik, Sukmin Chung, Mihyun Yang, Yogesh Kumar, Byung Hee Hong

Publikováno v: Nanoscale. 6:1474-1479

We report catalytic decomposition of few-layer graphene on an Au/SiOx/Si surface wherein oxygen is supplied by dissociation of the native SiOx layer at a relatively low temperature of 400 °C. The detailed chemical evolution of the graphene covered S

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cbf7f1c16315fbf87de0517d04d6f903
https://doi.org/10.1039/c3nr04692c

High open-circuit voltage of graphene-based photovoltaic cells modulated by layer-by-layer transfer

Autor: Jong Tae Lim, Sukmin Chung, Byung Hee Hong, Tai-Hee Kang, Kyung-Jae Lee, Geun Young Yeom, Kyuwook Ihm

Publikováno v: Surface and Interface Analysis. 44:744-748

Graphene has shown great application opportunities in future nanoelectronic devices because of its outstanding electronic properties. Moreover, its impressive optical properties have been attracting the interest of researchers, and, recently, the pho

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::525643fd3944d83e6bf1fe6a70dda850
https://doi.org/10.1002/sia.3860

Selective Reactions and Adsorption Geometries of a Multifunctional Molecule: cis-2-Butene-1,4-diol on Si(100)-2 × 1

Autor: Tai-Hee Kang, Hangil Lee, Sehun Kim, Han-Koo Lee, Bongsoo Kim, Ki-Jeong Kim, Sung-Soo Bae

Publikováno v: Langmuir. 26:1019-1023

The adsorption geometry of cis-2-butene-1,4-diol (BEDO, HOCH(2)CH=CHCH(2)OH) on Si(100)-2 x 1 was studied using scanning tunneling microscopy (STM), high resolution X-ray photoemission spectroscopy (XPS), and near-edge X-ray absorption fine structure

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0614d0501474654b302d0947ecebe11f
https://doi.org/10.1021/la902570y

Tetra-σ bonding adsorption of pyridine on Si(100)-2×1

Autor: Han-Koo Lee, Ki-Jeong Kim, Sehun Kim, Bongsoo Kim, Jinwook Chung, Tai-Hee Kang

Publikováno v: Journal of Electron Spectroscopy and Related Phenomena. 164:44-47

We studied adsorption of pyridine on Si(1 0 0) at room temperature using high resolution photoemission spectroscopy (PES) and near edge X-ray adsorption fine structure (NEXAFS) in the partial electron yield (PEY) mode. The Si 2p, C 1s, N 1s spectra o

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::42575d7a757e8b0ed037e3485cfc7f74
https://doi.org/10.1016/j.elspec.2008.05.005