Zobrazeno 1 - 10
of 82
pro vyhledávání: '"Tai D. Nguyen"'
Autor:
D. Petersohn
Publikováno v:
Materials and Corrosion/Werkstoffe und Korrosion. 47:581-581
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ecb97f93da274798547ac4e11ca5b5a4
https://doi.org/10.1002/maco.19960471016
https://doi.org/10.1002/maco.19960471016
Publikováno v:
Journal of Software: Evolution and Process.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::16ead8da3425bccb9531a128177db014
https://doi.org/10.1002/smr.2557
https://doi.org/10.1002/smr.2557
Publikováno v:
IEEE Symposium on Security and Privacy
Smart contracts are distributed, self-enforcing programs executing on top of blockchain networks. They have the potential to revolutionize many industries such as financial institutes and supply chains. However, smart contracts are subject to code-ba
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::504fcfda5f54d3e84a84f9199ed2c03e
http://arxiv.org/abs/2101.01917
http://arxiv.org/abs/2101.01917
Publikováno v:
ICSE
Smart contracts are Turing-complete programs that execute on the infrastructure of the blockchain, which often manage valuable digital assets. Solidity is one of the most popular programming languages for writing smart contracts on the Ethereum platf
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::98a7ec337f9394e0f253ed667a26b023
https://doi.org/10.1145/3377811.3380334
https://doi.org/10.1145/3377811.3380334
Publikováno v:
Journal of Materials Research. 8:2354-2361
The interaction of cobalt (Co) and low-pressure chemical-vapor-deposited silicon nitride (LPCVD Si3N4) during anneals from 200 °C−1000 °C in vacuum, Ar, and Ar–H2 ambient (95% Ar and 5% H2) has been studied. After the anneals, reduction of Si3N
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0b8796bd97204f9a327618a838f52e5e
https://doi.org/10.1557/jmr.1993.2354
https://doi.org/10.1557/jmr.1993.2354
Publikováno v:
Journal of Electron Microscopy Technique. 19:473-485
A simple method for preparing cross-sectional transmission electron microscopy specimens and discussions of possible artifacts from specimen preparation and observation of x-ray multilayer thin film structures are presented. The specimen preparation
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5503c9bb2a63227c528ed7275f3404de
https://doi.org/10.1002/jemt.1060190410
https://doi.org/10.1002/jemt.1060190410
Publikováno v:
Journal of Applied Physics. 70:3301-3313
Thin (3–300‐nm) oxides were grown on single‐crystal silicon substrates at temperatures from 523 to 673 K in a low‐pressure electron cyclotron resonance (ECR) oxygen plasma. Oxides were grown under floating, anodic or cathodic bias conditions,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bddb89ada91f6d690654bccce9221a97
https://doi.org/10.1063/1.349264
https://doi.org/10.1063/1.349264
Autor:
Eberhard Spiller, Marco Wedowski, Troy W. Barbee, Tai D. Nguyen, James A. Folta, Claude Montcalm, R. Fred Grabner, Saša Bajt, Paul B. Mirkarimi, Mark A. Schmidt, Christopher C. Walton
Publikováno v:
SPIE Proceedings.
Multilayer mirror coatings which reflect extreme UV (EUV) radiation are a key enabling technology for EUV lithography but must meet stringent requirements in terms of film quality, stability, and thickness control across multi optical elements up to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::31339e7f3c6bca99ea93dba8424aed0d
https://doi.org/10.1117/12.351156
https://doi.org/10.1117/12.351156
Autor:
Tai D. Nguyen, Troy W. Barbee
Publikováno v:
SPIE Proceedings.
The authors report a study of the residual stresses and residual stress relaxation in Mo/Si and Mo{sub 2}C/Si EUV multilayers. The multilayers were fabricated by magnetron sputter deposition, and stress measured using the substrate curvature laser sc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bf8da0d0680b081c38f6e275eda3f48a
https://doi.org/10.1117/12.331274
https://doi.org/10.1117/12.331274
Autor:
Tai D. Nguyen, Troy W. Barbee
Publikováno v:
MRS Proceedings. 522
The microstructure and mechanical properties of sputtered Cu/Ta multilayers were studied. X- ray diffraction and transmission electron microscopy characterization indicate that both the Ta and Cu in the 2 nm period multilayer are predominantly amorph
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1a051202b28e2f1eeee08f63ffbd4bab
https://doi.org/10.1557/proc-522-269
https://doi.org/10.1557/proc-522-269