Zobrazeno 1 - 10
of 22
pro vyhledávání: '"Tahereh G. Avval"'
Autor:
Linford, Behnam Moeini, Tahereh G. Avval, Hidde H. Brongersma, Stanislav Průša, Pavel Bábík, Elena Vaníčková, Brian R. Strohmeier, David S. Bell, Dennis Eggett, Steven M. George, Matthew R.
Publikováno v:
Materials; Volume 16; Issue 13; Pages: 4688
Delayed atomic layer deposition (ALD) of ZnO, i.e., area selective (AS)-ALD, was successfully achieved on silicon wafers (SiSiO2) terminated with tris(dimethylamino)methylsilane (TDMAMS). This resist molecule was deposited in a home-built, near-atmos
Autor:
Behnam Moeini, Joshua W. Pinder, Tahereh G. Avval, Collin Jacobsen, Hidde H. Brongersma, Stanislav Průša, Pavel Bábík, Elena Vaníčková, Morris D. Argyle, Brian R. Strohmeier, Brian Jones, Daniel Shollenberger, David S. Bell, Matthew Linford
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f53d9f1fdf47d1ca27463253a6e814b3
https://doi.org/10.2139/ssrn.4449843
https://doi.org/10.2139/ssrn.4449843
Autor:
Tahereh G. Avval, Stanislav Průša, Cody V. Cushman, Grant T. Hodges, Sarah Fearn, Seong H. Kim, Jan Čechal, Elena Vaníčková, Pavel Bábík, Tomáš Šikola, Hidde H. Brongersma, Matthew R. Linford
Publikováno v:
Applied Surface Science, 607:154551. Elsevier
Surface silanols (SiOH) are important moieties on glass surfaces. Here we present a tag-and-count approach for determining surface silanol densities, which consists of tagging surface silanols with Zn via atomic layer deposition (ALD) followed by det
Autor:
Brian I. Johnson, Daniel H. Ess, Anubhav Diwan, Tahereh G. Avval, Joshua Wheeler, Kara J. Stowers, Hans C. Anderson, Matthew R. Linford
Publikováno v:
Langmuir. 36:1878-1886
Here, we address the issue of finding correct CF2/CF3 area ratios from X-ray photoelectron spectroscopy (XPS) C 1s narrow scans of materials containing -CH2CH2(CF2)nCF3 (n = 0, 1, 2, ...) moieties. For this work, we modified silicon wafers with four
Autor:
Matthew Linford, Tahereh G. Avval, Stanislav Průša, Cody V. Cushman, Grant T. Hodges, Sarah Fearn, Jan Čechal, Tomáš Šikola, Hidde H. Brongersma
Publikováno v:
SSRN Electronic Journal.
Autor:
Tahereh G. Avval, Hyrum Haack, Neal Gallagher, David Morgan, Pascal Bargiela, Neal Fairley, Vincent Fernandez, Matthew R. Linford
Publikováno v:
Journal of Vacuum Science & Technology A. 40:063205
Chemometrics/informatics, and data analysis in general, are increasingly important in x-ray photoelectron spectroscopy (XPS) because of the large amount of information (spectra/data) that is often collected in degradation, depth profiling, operando,
Autor:
Tahereh G. Avval, Neal Gallagher, David Morgan, Pascal Bargiela, Neal Fairley, Vincent Fernandez, Matthew R. Linford
Publikováno v:
Journal of Vacuum Science & Technology A. 40:063206
Chemometrics/informatics and data analysis, in general, are increasingly important topics in x-ray photoelectron spectroscopy (XPS) because of the large amount of information (data/spectra) that are often collected in degradation, depth profiling, op
Autor:
Tahereh G. Avval, Vincent Fernandez, Emily F. Smith, Matthew R. Linford, Neal B. Gallagher, Bonnie J. Tyler, Behnam Moeini, Victoria Carver, Neal Fairley, Jonas Baltrusaitis
Publikováno v:
Journal of Chemical Information and Modeling
Journal of Chemical Information and Modeling, American Chemical Society, 2021, 61 (9), pp.4173-4189. ⟨10.1021/acs.jcim.1c00244⟩
Journal of Chemical Information and Modeling, American Chemical Society, 2021, 61 (9), pp.4173-4189. ⟨10.1021/acs.jcim.1c00244⟩
Unsupervised exploratory data analysis (EDA) is often the first step in understanding complex data sets. While summary statistics are among the most efficient and convenient tools for exploring and describing sets of data, they are often overlooked i
Autor:
Tuhin Roychowdhury, Dhruv Shah, Alberto Herrera-Gomez, George H. Major, Vincent Fernandez, Mark T. Greiner, Tahereh G. Avval, Dhananjay I. Patel, Paul J. Pigram, Anders J. Barlow, Matthew R. Linford
Publikováno v:
Surface and Interface Analysis
Surface and Interface Analysis, Wiley-Blackwell, 2021, ⟨10.1002/sia.6958⟩
Surface and Interface Analysis, Wiley-Blackwell, 2021, ⟨10.1002/sia.6958⟩
International audience; Although the fundamental, theoretical peak shape in X-ray photoelectron spectroscopy (XPS) is Lorentzian, some Gaussian character is observed in most XPS signals. Additional complexity in the form of asymmetry is also found in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::396dee12b30d39638221a4a5bc2d4373
https://hal.archives-ouvertes.fr/hal-03266373
https://hal.archives-ouvertes.fr/hal-03266373
Autor:
Sean C. Chapman, Tahereh G. Avval, Anselmo Elcana de Oliveira, Wade C. Ellis, Paul B. Farnsworth, Tatiana de Oliveira Zuppa Neto, Nelson Roberto Antoniosi Filho, Pedro Augusto de Oliveira Morais, Matthew R. Linford
Publikováno v:
Journal of the American Society for Mass Spectrometry. 31(7)
Petroleomics, which is the characterization, separation, and quantification of the components of petroleum and crude oil, is an emerging area of study. However, the repertoire of analytical methods available to understand commercial automotive lubric