Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Taek-Yong Kim"'
Autor:
Min Hee Cho, Namho Jeon, Taek Yong Kim, Moonyoung Jeong, Sungsam Lee, Jong Seo Hong, Hyeong Sun Hong, Satoru Yamada
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 6, Pp 494-499 (2018)
This paper is the first to propose an innovative method for measuring variations in dynamic random access memory (DRAM) cell transistors. Structural dispersion induces an extremely high cell leakage current, which determines aspects of DRAM performan
Externí odkaz:
https://doaj.org/article/617f2a67dd8f4191899b3f82860e9bd6
Autor:
S. Chandramohan, Kang Bok Ko, Jong Han Yang, Beo Deul Ryu, Y. S. Katharria, Taek Yong Kim, Byung Jin Cho, Chang-Hee Hong
Publikováno v:
Journal of Applied Physics; 2014, Vol. 115 Issue 5, p1-7, 7p, 5 Graphs
Autor:
Young-Chul Kim, Taek-Yong Kim
Publikováno v:
The 7th International Conference on Advanced Communication Technology, 2005, ICACT 2005..
In this paper, considerations on the algorithm that makes the use of general tree structure to enable readily modifiable UI menu structure in an efficient way in terms of time and resource (available memory) of CPUs are described. First, it describes
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::99f84fa266f99224bba9b50a50826d87
https://doi.org/10.1109/icact.2005.245949
https://doi.org/10.1109/icact.2005.245949
Publikováno v:
ECS Meeting Abstracts. :264-264
not Available.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f6ef6c20377d5bd04ab6abcb20141cfc
https://doi.org/10.1149/ma2012-02/3/264
https://doi.org/10.1149/ma2012-02/3/264
Publikováno v:
Applied Physics Letters; 5/5/2014, Vol. 104 Issue 18, p1-3, 3p, 3 Graphs