Zobrazeno 1 - 10
of 19
pro vyhledávání: '"Taek-Yong Kim"'
Autor:
Min Hee Cho, Namho Jeon, Taek Yong Kim, Moonyoung Jeong, Sungsam Lee, Jong Seo Hong, Hyeong Sun Hong, Satoru Yamada
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 6, Pp 494-499 (2018)
This paper is the first to propose an innovative method for measuring variations in dynamic random access memory (DRAM) cell transistors. Structural dispersion induces an extremely high cell leakage current, which determines aspects of DRAM performan
Externí odkaz:
https://doaj.org/article/617f2a67dd8f4191899b3f82860e9bd6
Autor:
S. Chandramohan, Kang Bok Ko, Jong Han Yang, Beo Deul Ryu, Y. S. Katharria, Taek Yong Kim, Byung Jin Cho, Chang-Hee Hong
Publikováno v:
Journal of Applied Physics; 2014, Vol. 115 Issue 5, p1-7, 7p, 5 Graphs
Autor:
Young-Chul Kim, Taek-Yong Kim
Publikováno v:
7th International Conference on Advanced Communication Technology, 2005 (ICACT 2005); 2005, p627-630, 4p
Publikováno v:
ECS Meeting Abstracts. :264-264
not Available.
Publikováno v:
Applied Physics Letters; 5/5/2014, Vol. 104 Issue 18, p1-3, 3p, 3 Graphs
Publikováno v:
Proceedings of SPIE; 10/1/2018, Vol. 10846, p1-13, 13p
Autor:
Cheol Shin, Woo, Yoon, Taeshik, Hun Mun, Jeong, Yong Kim, Taek, Choi, Sung-Yool, Kim, Taek-Soo, Jin Cho, Byung
Publikováno v:
Applied Physics Letters; 12/9/2013, Vol. 103 Issue 24, p243504, 5p, 4 Graphs
Publikováno v:
7th International Conference on Advanced Communication Technology, 2005 (ICACT 2005); 2005, p571-573, 3p
Publikováno v:
7th International Conference on Advanced Communication Technology, 2005 (ICACT 2005); 2005, p574-574, 1p
Autor:
Hong, Seul Ki, Kim, Ki Yeong, Kim, Taek Yong, Kim, Jong Hoon, Park, Seong Wook, Kim, Joung Ho, Cho, Byung Jin
Publikováno v:
Nanotechnology; 11/16/2012, Vol. 23 Issue 45, p1-1, 1p