Zobrazeno 1 - 5
of 5
pro vyhledávání: '"TaeHong Ha"'
Autor:
Jeong Rae Yoo, Tae-Jin Kim, Sang Taek Heo, Kyung-Ah Hwang, Hyunjoo Oh, TaeHong Ha, Hye Kyung Ko, Seungjae Baek, Ju Eun Kim, Jun Hyeong Kim, Jiin Lee, Min Ji Kang, Mi Soo Yoo, Jung Mogg Kim, Kyung-Mi Lee, Keun Hwa Lee
Publikováno v:
Frontiers in Immunology, Vol 12 (2021)
Severe fever with thrombocytopenia syndrome (SFTS) is a new tick-borne viral disease, and most SFTS virus (SFTSV) infections occur via bites from the tick Haemaphysalis longicornis; however, SFTSV transmission can also occur through close contact wit
Externí odkaz:
https://doaj.org/article/6e61afef1b034aba85d6c6367980c177
Autor:
Hye Kyung Ko, Jun Hyeong Kim, Seungjae Baek, Tae Jin Kim, Min Ji Kang, Jung Mogg Kim, Jeong Rae Yoo, Kyung Mi Lee, Kyung-Ah Hwang, Sang Taek Heo, Keun Hwa Lee, Ju Eun Kim, Mi Soo Yoo, Jiin Lee, TaeHong Ha, Hyunjoo Oh
Publikováno v:
Frontiers in Immunology
Frontiers in Immunology, Vol 12 (2021)
Frontiers in Immunology, Vol 12 (2021)
Severe fever with thrombocytopenia syndrome (SFTS) is a new tick-borne viral disease, and most SFTS virus (SFTSV) infections occur via bites from the tick Haemaphysalis longicornis; however, SFTSV transmission can also occur through close contact wit
Autor:
Taehong Ha, Insoo Cho, Hyuck-Chai Jung, Sanghyeon Jeon, Kyu-Pil Lee, Youngwoo Kim, Taewoo Lee
Publikováno v:
International Symposium for Testing and Failure Analysis.
We demonstrate an effective way of reducing off-leakage current in sub-wordline driver pMOSFETs with lightly-doped source/drain, where gate-induced drain leakage current is much relaxed, compared with those of asymmetric source/drain. In mobile DRAM,
Autor:
Hoon Lim, Soon-Moon Jung, Youngseop Rah, Taehong Ha, Hanbyung Park, Chulsoon Chang, Wonsuk Cho, Jaikyun Park, Byoungkeun Son, Jaehun Jeong, Hoosung Cho, Bonghyun Choi, Kinam Kim
Publikováno v:
Proceedings of 35th European Solid-State Device Research Conference, 2005 (ESSDERC 2005); 2005, p549-552, 4p
Autor:
Soon-Moon Jung, Youngseop Rah, Taehong Ha, Hanbyung Park, Chulsoon Chang, Seungchul Lee, Jongho Yun, Wonsuk Cho, Hoon Lim, Jaikyun Park, Jaehun Jeong, Byoungkeun Son, Jaehoon Jang, Bonghyun Choi, Hoosung Cho, Kinam Kim
Publikováno v:
2005 Digest of Technical Papers. 2005 Symposium on VLSI Technology; 2005, p220-221, 2p